Precise determination of crystal lattice parameters

V.V. Lider
Federal Scientific Research Center "Crystallography and Photonics", Russian Academy of Sciences, Shubnikov Institute of Crystallography, Russian Academy of Sciences, Leninskii prosp. 59, Moscow, 119333, Russian Federaion

Precision X-ray methods for absolute and relative determination of crystal lattice parameters (interplanar distances) are described and compared, including the X-ray divergent-beam (Kossel) technique, the Bond method, the Renninger method, the back reflection method, the interference method, and the method of standards. It is shown that for most of the considered methods, a relative accuracy of ~10⁻⁵—10⁻⁶ for determining the lattice parameters is usually achievable, with the last two methods giving a much greater accuracy, at the level of ~10⁻⁸—10⁻⁹.

Keywords: X-ray radiation, diffraction, Bragg angle, crystal lattice parameter, interplane distance
PACS: 06.20.Jr, 07.85.−m, 61.05.cp, 61.50.−f (all)
DOI: 10.3367/UFNe.2019.07.038599
URL: https://ufn.ru/en/articles/2020/9/d/
Web of Science

000597245700004
Scopus

2-s2.0-85098656998
ADS NASA

2020PhyU...63..907L
Citation: Lider V V "Precise determination of crystal lattice parameters" Phys. Usp. 63 907–928 (2020)

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Received: 14th, May 2019, revised: 1st, July 2019, accepted: 2nd, July 2019

Оригинал: Лидер В В «Прецизионное определение параметров кристаллической решётки» УФН 190 971–994 (2020); DOI: 10.3367/UFNr.2019.07.038599

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