Precision X-ray methods for absolute and relative determination of crystal lattice parameters (interplanar distances) are described and compared, including the X-ray divergent-beam (Kossel) technique, the Bond method, the Renninger method, the back reflection method, the interference method, and the method of standards. It is shown that for most of the considered methods, a relative accuracy of ~10⁻⁵—10⁻⁶ for determining the lattice parameters is usually achievable, with the last two methods giving a much greater accuracy, at the level of ~10⁻⁸—10⁻⁹.

Keywords: X-ray radiation, diffraction, Bragg angle, crystal lattice parameter, interplane distance PACS: 06.20.Jr, 07.85.−m, 61.05.cp, 61.50.−f (all) DOI: 10.3367/UFNe.2019.07.038599 URL: https://ufn.ru/en/articles/2020/9/d/ 000597245700004 2-s2.0-85098656998 2020PhyU...63..907L Citation: Lider V V "Precise determination of crystal lattice parameters" Phys. Usp. 63 907–928 (2020) BibTexBibNote ® (generic)BibNote ® (RIS)MedlineRefWorks Received: 14th, May 2019, revised: 1st, July 2019, accepted: 2nd, July 2019 Оригинал: Лидер В В «Прецизионное определение параметров кристаллической решётки» УФН 190 971–994 (2020); DOI: 10.3367/UFNr.2019.07.038599