07.85.−m X- and γ-ray instruments
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E.N. Ragozin, E.A. Vishnyakov et al “Soft X-ray spectrometers based on aperiodic reflection gratings and their application” 64 495–514 (2021)
07.60.−j, 07.85.−m, 07.85.Fv, 07.85.Nc, 07.87.+v, 42.79.−e (all)
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V.V. Lider “Precise determination of crystal lattice parameters” 63 907–928 (2020)
06.20.Jr, 07.85.−m, 61.05.cp, 61.50.−f (all)
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G.V. Fetisov “X-ray diffraction methods for structural diagnostics of materials: progress and achievements” 63 2–32 (2020)
07.85.−m, 42.55.Vc, 61.05.C− (all)
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V.V. Lider “Multilayer X-ray interference structures” 62 1063–1095 (2019)
07.85.−m, 41.50.+h, 42.79.Dj, 42.88.+h, 61.05.cp, 78.20.Bh, 78.67.Pt, 95.55.Ka (all)
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A.S. Lidvansky “G.T. Zatsepin and birth of gamma-ray astronomy” 61 921–925 (2018)
07.85.−m, 29.40Ka, 95.55.Ka, 95.85.Pw (all)
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V.M. Aul’chenko, V.V. Zhulanov et al “The fast processes investigation by X-ray diffraction methods in the Siberian Center of Synchrotron and Terahertz Radiation” 61 515–530 (2018)
07.85.−m
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V.V. Lider “X-ray crystal interferometers” 57 1099–1117 (2014)
07.85.−m, 41.50.+h, 61.05.cp (all)
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G.N. Kulipanov “Ginzburg’s invention of undulators and their role in modern synchrotron radiation sources and free electron lasers” 50 368–376 (2007)
01.10.Fv, 07.85.−m, 07.85.Qe, 41.60.Cr (all)
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L.V. Al’tshuler, S.M. Bakhrakh et al “Veniamin Aronovich Tsukerman (Obituary)” 36 (7) 650–651 (1993)
01.60.+q, 07.85.−m (all)
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V.A. Belyakov, V.E. Dmitrienko “Polarization phenomena in x-ray optics” 32 697–719 (1989)
41.50.+h, 07.85.−m, 42.79.Ci (all)
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V.L. Indenbom, F.N. Chukhovskii “X-ray Optics” 14 368–369 (1971)
41.50.+h, 42.30.−d, 07.85.−m (all)
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N.Ya. Molotkov “Illustration of X-ray photography of a rotating crystal with the aid of centimeter electromagnetic waves” 12 297–299 (1969)
07.85.−m, 07.68.+m, 61.50.−f (all)
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V.K. Tomas “Three letters of russian physicists to W. K. Roentgen” 9 913–915 (1967)
01.65.+g, 07.85.−m (all)
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D.A. Zolotov, V.E. Asadchikov et al “New approaches to three-dimensional reconstruction of dislocations in silicon by x-ray topo-tomography”, accepted
07.85.−m, 61.72.−y, 61.72.Bb (all)
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V.V. Lider “X-ray interferometers Talbot and Talbot—Lau”, accepted
07.85.−m, 41.50.+h, 42.79.Dj, 87.59.−e (all)
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V.V. Lider “X-ray refraction introscopy”, accepted
07.85.−m, 41.50.+h, 87.59.−e, 61.05.Ñ, 78.20.Bh (all)
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