PACS numbers

07.85.−m X- and γ-ray instruments
  1. E.N. Ragozin, E.A. Vishnyakov et alSoft X-ray spectrometers based on aperiodic reflection gratings and their application64 495–514 (2021)
    07.60.−j, 07.85.−m, 07.85.Fv, 07.85.Nc, 07.87.+v, 42.79.−e (all)
  2. V.V. Lider “Precise determination of crystal lattice parameters63 907–928 (2020)
    06.20.Jr, 07.85.−m, 61.05.cp, 61.50.−f (all)
  3. G.V. Fetisov “X-ray diffraction methods for structural diagnostics of materials: progress and achievements63 2–32 (2020)
    07.85.−m, 42.55.Vc, 61.05.C− (all)
  4. V.V. Lider “Multilayer X-ray interference structures62 1063–1095 (2019)
    07.85.−m, 41.50.+h, 42.79.Dj, 42.88.+h, 61.05.cp, 78.20.Bh, 78.67.Pt, 95.55.Ka (all)
  5. A.S. Lidvansky “G.T. Zatsepin and birth of gamma-ray astronomy61 921–925 (2018)
    07.85.−m, 29.40Ka, 95.55.Ka, 95.85.Pw (all)
  6. V.M. Aul’chenko, V.V. Zhulanov et alThe fast processes investigation by X-ray diffraction methods in the Siberian Center of Synchrotron and Terahertz Radiation61 515–530 (2018)
    07.85.−m
  7. V.V. Lider “X-ray crystal interferometers57 1099–1117 (2014)
    07.85.−m, 41.50.+h, 61.05.cp (all)
  8. G.N. Kulipanov “Ginzburg’s invention of undulators and their role in modern synchrotron radiation sources and free electron lasers50 368–376 (2007)
    01.10.Fv, 07.85.−m, 07.85.Qe, 41.60.Cr (all)
  9. L.V. Al’tshuler, S.M. Bakhrakh et alVeniamin Aronovich Tsukerman (Obituary)36 (7) 650–651 (1993)
    01.60.+q, 07.85.−m (all)
  10. V.A. Belyakov, V.E. Dmitrienko “Polarization phenomena in x-ray optics32 697–719 (1989)
    41.50.+h, 07.85.−m, 42.79.Ci (all)
  11. V.L. Indenbom, F.N. Chukhovskii “X-ray Optics14 368–369 (1971)
    41.50.+h, 42.30.−d, 07.85.−m (all)
  12. N.Ya. Molotkov “Illustration of X-ray photography of a rotating crystal with the aid of centimeter electromagnetic waves12 297–299 (1969)
    07.85.−m, 07.68.+m, 61.50.−f (all)
  13. V.K. Tomas “Three letters of russian physicists to W. K. Roentgen9 913–915 (1967)
    01.65.+g, 07.85.−m (all)
  14. D.A. Zolotov, V.E. Asadchikov et alNew approaches to three-dimensional reconstruction of dislocations in silicon by x-ray topo-tomography”, accepted
    07.85.−m, 61.72.−y, 61.72.Bb (all)
  15. V.V. Lider “X-ray interferometers Talbot and Talbot—Lau”, accepted
    07.85.−m, 41.50.+h, 42.79.Dj, 87.59.−e (all)
  16. V.V. Lider “X-ray refraction introscopy”, accepted
    07.85.−m, 41.50.+h, 87.59.−e, 61.05.Ñ, 78.20.Bh (all)
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