Articles
- V.V. Lider “Precise determination of crystal lattice parameters” 63 907–928 (2020)
- V.V. Lider “Multilayer X-ray interference structures” 62 1063–1095 (2019)
- V.V. Lider “X-ray fluorescence imaging” 61 980–999 (2018)
- V.V. Lider “X-ray microscopy” 60 187–203 (2017)
- V.V. Lider “X-ray holography” 58 365–383 (2015)
- V.V. Lider “X-ray crystal interferometers” 57 1099–1117 (2014)
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See also:
V.L. Indenbom,
F.N. Chukhovskii,
V.E. Dmitrienko,
V.A. Belyakov,
A.V. Andreev,
Yu.P. Chertov,
V.A. Arkad’ev,
A.I. Kolomiitsev,
I.Yu. Ponomarev,
I.A. Khodeev,
M.N. Toropov,
I.M. Shakhparonov,
N.N. Salashchenko,
N.I. Chkhalo,
V.S. Panasyuk
PACS: 41.50.+h, 07.85.-m, 87.59.-e, 61.05.cp, 61.50.-f, 06.20.Jr, 61.05.-a, 42.40.-i, 07.85.Tt, 42.79.-e, 61.05.cj, 95.55.Ka, 78.67.Pt, 78.20.Bh, 42.88.+h
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