RSS feeds
РусскийEnglish
Issue 4, 2024
Volume year page
Issues Authors PACS Subscription For authors

Issues

 / 

2020

 / 

September

←  →

Reviews of topical problems


Precise determination of crystal lattice parameters


Federal Scientific Research Center "Crystallography and Photonics", Russian Academy of Sciences, Shubnikov Institute of Crystallography, Russian Academy of Sciences, Leninskii prosp. 59, Moscow, 119333, Russian Federaion

Precision X-ray methods for absolute and relative determination of crystal lattice parameters (interplanar distances) are described and compared, including the X-ray divergent-beam (Kossel) technique, the Bond method, the Renninger method, the back reflection method, the interference method, and the method of standards. It is shown that for most of the considered methods, a relative accuracy of ~10−5—10−6 for determining the lattice parameters is usually achievable, with the last two methods giving a much greater accuracy, at the level of ~10−8—10−9.

Fulltext pdf (6 MB)
Fulltext is also available at DOI: 10.3367/UFNe.2019.07.038599
Keywords: X-ray radiation, diffraction, Bragg angle, crystal lattice parameter, interplane distance
PACS: 06.20.Jr, 07.85.−m, 61.05.cp, 61.50.−f (all)
DOI: 10.3367/UFNe.2019.07.038599
URL: https://ufn.ru/en/articles/2020/9/d/
000597245700004
2-s2.0-85098656998
2020PhyU...63..907L
Citation: Lider V V "Precise determination of crystal lattice parameters" Phys. Usp. 63 907–928 (2020)
BibTexBibNote ® (generic)BibNote ® (RIS)MedlineRefWorks

Received: 14th, May 2019, revised: 1st, July 2019, 2nd, July 2019

Оригинал: Лидер В В «Прецизионное определение параметров кристаллической решётки» УФН 190 971–994 (2020); DOI: 10.3367/UFNr.2019.07.038599

References (298) ↓ Cited by (7) Similar articles (20)

  1. Schwarzenbach D et al Acta Cryst. A 45 63 (1989)
  2. Hart M J. Cryst. Growth 55 409 (1981)
  3. Fewster P F J. Mater. Sci. Mater. Electron. 10 175 (1999)
  4. Galdecka E International Tables For Crystallography Vol. C (New York: Wiley, 2006) p. 505
  5. Lisoivan V I Izmereniya Parametrov Elementarnoi Yacheiki na Odnokristal’nom Spektrometre (Novosibirsk: Nauka, 1982)
  6. Kossel W, Loeck V, Voges H Z. Phys. 94 139 (1935)
  7. Kossel W Gött. Nachr. Math. Naturwiss. 1 229 (1935)
  8. Kossel W, Voges H Ann. Physik 23 677 (1935)
  9. Kossel W Ann. Physik 25 512 (1936)
  10. Lonsdale K Philos. Trans. R. Soc. Lond. A 240 219 (1947)
  11. Yakowitz H J. Appl. Phys. 37 4455 (1966)
  12. Tixier R, Waché C J. Appl. Cryst. 3 466 (1970)
  13. Aristov V V, Shekhtman V Sh, Shmyt’ko I M Kristallogr. 18 706 (1973); Aristov V V, Shekhtman V Sh, Shmyt’ko I M Sov. Phys. Crystallogr. 18 445 (1973)
  14. Pekarev A I, Chistyakov Yu D Zavodskaya Laboratoriya 35 1075 (1969)
  15. Dingley D J Scanning 1 79 (1978)
  16. Langer E, Däbritz S IOP Conf. Mater. Sci. Eng. 7 012015 (2010)
  17. Lider V V Kristallogr. 56 196 (2011); Lider V V Crystallogr. Rep. 56 169 (2011)
  18. Borrmann G Naturwissenschaften 23 591 (1935)
  19. Borrmann G Ann. Physik 27 669 (1936)
  20. Isherwood B J, Wallace C A Nature 212 173 (1966)
  21. Lamaze J P, Despujols J J. Phys. E 9 41 (1976)
  22. Castaing R Ph.D. Thesis (Paris: Univ. de Paris, 1951)
  23. Castaing R, Guinier A C.R. Acad. Sci. Paris 232 1948 (1951)
  24. Yakowitz H The Divergent Beam (Kossel) X-Ray Method And Its Uses In Measuring Strain Contours In An Individual Grain Of Fe-3 Weight Percent Si Transformer Sheet (Washington, DC: National Bureau of Standards, 1973)
  25. Frazer J Z, Keil K, Reid A M Am. Mineral. 54 554 (1969)
  26. Dingley D J, Ferran G Micron 8 145 (1977)
  27. Langer E et al Appl. Surf. Sci. 179 45 (2001)
  28. Böhling M, Bauch J Cryst. Res. Technol. 42 905 (2007)
  29. Bouscaud D et al Ultramicroscopy 115 115 (2012)
  30. Umeno M, Kawabe H, Shinoda G Adv. X-Ray Anal. 9 23 (1966)
  31. Mendelssohn M J, Milledge H J Acta Cryst. A 55 204 (1999)
  32. Lider V V, Rozhanskii V N Fiz. Tverd. Tela 9 3541 (1967)
  33. Hejna J et al Scanning 8 177 (1986)
  34. Ullrich H-J et al Mikrochim. Acta 107 283 (1992)
  35. Däbritz S, Langer E, Hauffe W J. Anal. At. Spectrom. 14 409 (1999)
  36. Nikl M Meas. Sci. Technol. 17 R37 (2006)
  37. Ullrich H Mikrochim. Acta 101 19 (1990)
  38. Berveiller S et al Mater. Sci. Forum 490-491 159 (2005)
  39. Lider V V, Chukhovskii F N, Rozhanskii V N Fiz. Tverd. Tela 19 1231 (1977); Lider V V, Chukhovskii F N, Rozhanskii V N Sov. Phys. Solid State 19 816 (1977)
  40. Hanneman R E, Ogilvie R E, Modrzejewski A J. Appl. Phys. 33 1429 (1962)
  41. Kumakhov M A X-Ray Spectrom. 29 343 (2000)
  42. MacDonald C A X-Ray Opt. Instrum. 2010 1 (2010)
  43. Ternov I M, Mikhailin V V Sinkhrotronnoe Izluchenie. Teoriya i Eksperiment (M.: Energoatomizdat, 1986)
  44. Langer E et al Appl. Surf. Sci. 252 240 (2005)
  45. Langer E, Haschke M, Däbritz S Microchim. Acta 161 455 (2008)
  46. Bortel G et al J. Synchrotron Rad. 23 214 (2016)
  47. Ullrich H-J, Schlaubitz M, Friedel F Nucl. Instrum. Meth. Phys. Res. A 349 269 (1994)
  48. Bauch J et al Cryst. Res. Technol. 34 71 (1999)
  49. Schetelich Ch, Brenner S, Geist V J. Synchrotron Rad. 5 102 (1998)
  50. Schetelich Ch et al Nucl. Instrum. Meth. Phys. Res. B 103 236 (1995)
  51. Glazer A M et al J. Synchrotron Radiat. 11 187 (2004)
  52. Glazer A M Philos. Trans. R. Soc. Lond. A 373 20140232 (2015)
  53. Bearden J A Rev. Mod. Phys. 39 78 (1967)
  54. Cohen E R, Taylor B N J. Res. Natl. Bureau Stand. 92 85 (1987)
  55. Ullrich H-J et al Krist. Tech. 7 1153 (1972)
  56. Harris N J. Mater. Sci. 10 279 (1975)
  57. Weber S, Schetelich Ch, Geist V Cryst. Res. Technol. 29 727 (1994)
  58. Weber S J. Appl. Cryst. 30 85 (1997)
  59. Langer E, Kurt R, Daebritz S Cryst. Res. Technol. 34 801 (1999)
  60. Maurice C, Fortunier R J Microscopy 230 520 (2008)
  61. Gielen P et al J. Appl. Phys. 36 773 (1965)
  62. Heise B H J. Appl. Phys. 33 697 (1962)
  63. Morris W G J. Appl. Phys. 39 1813 (1968)
  64. Harris N, Kirkham A J J. Appl. Cryst. 4 232 (1971)
  65. Biggin S, Dingley D J J. Appl. Cryst. 10 376 (1977)
  66. Brechbühl J, Bauch J, Ullrich H-J Cryst. Res. Technol. 34 59 (1999)
  67. Heise H J. Appl. Phys. 33 938 (1962)
  68. Lutts A, Gielen P J J. Appl. Cryst. 4 242 (1971)
  69. Spooner F J, Wilson C G J. Appl. Cryst. 6 132 (1973)
  70. Isherwood B J J. Appl. Cryst. 1 299 (1968)
  71. Isherwood B J, Wallace C A Acta Cryst. A 27 119 (1971)
  72. Isherwood B J, Brown B R, Halliwell M A J. Cryst. Growth 54 449 (1981)
  73. Isherwood B J, Brown B R, Halliwell M A J. Cryst. Growth 60 33 (1982)
  74. Glass H L, Moudi L A J. Appl. Cryst. 7 22 (1974)
  75. Yakowitz H J. Appl. Phys. 43 4793 (1972)
  76. Morawiec A, Pesci R, Lecomte J S Ceram. Trans. 201 163 (2008)
  77. Morawiec A J. Appl. Cryst. 49 322 (2016)
  78. Bouscaud D et al J. Appl. Cryst. 47 1699 (2014)
  79. Shekhtman V Sh i dr Dokl. Akad. Nauk SSSR 205 834 (1972)
  80. Newman B A J. Appl. Cryst. 3 191 (1970)
  81. Imura T, Weissmann S, Slade J J (Jr.) Acta Cryst. 15 786 (1962)
  82. Berg H M, Hall E L Adv. X-Ray Anal. 18 454 (1975)
  83. Ellis T et al J. Appl. Phys. 35 3364 (1964)
  84. Kalman Z H et al Metall. Trans. A 19 217 (1988)
  85. Newman B A, Weissmann S J. Appl. Cryst. 1 139 (1968)
  86. Newman B A, Shrier A J. Appl. Cryst. 3 280 (1970)
  87. Koishi Y, Gillies D C Am. Mineral. 64 211 (1979)
  88. Aristov V V, Shmytko I M J. Appl. Cryst. 11 662 (1978)
  89. Lin A L, Donaghey L F J. Electron. Mater. 6 383 (1977)
  90. Lider V V "Novye vozmozhnosti primeneniya difraktsii shiroko raskhodyashchegosya puchka rentgenovskikh luchei" Disc. ... kand. fiz.-mat. nauk (M.: In-t kristallografii im. A.V. Shubnikova, AN SSSR, 1977)
  91. Pinsker Z G Dinamicheskoe Rasseyanie Rentgenovskikh Luchei v Ideal’nykh Kristallakh (M.: Nauka, 1974)
  92. James R W The Optical Principles Of The Diffraction Of X-Rays (London: Bell, 1967); Per. na russk. yaz., Dzheims R Opticheskie Printsipy Difraktsii Rentgenovskikh Luchei (M.: IL, 1950)
  93. Lutts A J. Appl. Cryst. 6 428 (1973)
  94. Bond W L Acta Cryst. 13 814 (1960)
  95. Baker T W et al Adv. X-Ray Anal. 11 359 (1968)
  96. Segmuller A Adv. X-Ray Anal. 13 455 (1970)
  97. Godwod K, Kowalczyk R, Szmid Z Phys. Status Solidi A 21 227 (1974)
  98. Hubbard C R, Mauer F A J. Appl. Cryst. 9 1 (1976)
  99. Lukaszewicz K et al Krist. Tech. 13 561 (1978)
  100. Bartels W J J. Vac. Sci. Technol. B 1 338 (1983)
  101. Grosswig S et al Cryst. Res. Technol. 18 501 (1983)
  102. Schmidbauer M, Kwasniewski A, Schwarzkopf J Acta Cryst. B 68 8 (2012)
  103. Shikata S et al Jpn. J. Appl. Phys. 57 111301 (2018)
  104. Willoughby A F W, Driscoll C M H, Bellamy B A J. Mater. Sci. 6 1389 (1971)
  105. Nakajima M et al Appl. Phys. Lett. 49 1251 (1986)
  106. Usuda K et al Jpn. J. Appl. Phys. 29 L210 (1990)
  107. Chen N F et al Rigaku J. 13 16 (1996)
  108. Wokulska K et al Solid State Phenom. 163 264 (2010)
  109. Paszkowski R et al Cryst. Res. Technol. 48 413 (2013)
  110. Paszkowski R, Wokulska K, Dec J Cryst. Res. Technol. 52 1600368 (2017)
  111. Kucharczyk D, Niklewski T J. Appl. Cryst. 12 370 (1979)
  112. Ridou C, Rousseau M, Freund A J. Phys. Lett. 38 359 (1977)
  113. Horváth J, Kucharczyk D Phys. Status Solidi A 63 687 (1981)
  114. Pietraszko A et al Phase Transit. 1 99 (1979)
  115. Pietraszko A, Tomaszewski P E, Lukaszewicz K Phase Transit. 2 131 (1981)
  116. Okada Y, Tokumaru Y J. Appl. Phys. 56 314 (1984)
  117. Bublik V T, Konyaeva E P, Smirnov I S Zavodskaya Laboratoriya 42 284 (1976)
  118. Bublik V T, Wilke J, Pereversev A Phys. Status Solidi A 73 K271 (1982)
  119. Ono F, Maeta H J. Phys. Colloq. 49 C8-63 (1988)
  120. Haruna K et al Jpn. J. Appl. Phys. 31 2527 (1992)
  121. Saotome T et al J. Phys. Condens. Matter 10 1267 (1998)
  122. Giles C et al J. Synchrotron Rad. 12 349 (2005)
  123. Ratuszna A et al Phys. Status Solidi A 54 739 (1979)
  124. Kucharczyk D, Pietraszko A, Lukaszewicz K Phys. Status Solidi A 37 287 (1976)
  125. Åsbrink S, Wolcyrz M, Hong S-H Phys. Status Solidi A 87 135 (1985)
  126. Okada Y, Tokumaru Y, Kadota Y Appl. Phys. Lett. 48 975 (1986)
  127. Yasuami S et al J. Cryst. Growth 100 600 (1990)
  128. Usuda K, Ando M J. Appl. Phys. 80 1352 (1996)
  129. Grosswig S, Härtwig J, Schellenberger U Phys. Status Solidi A 76 241 (1983)
  130. Dressler L, Griebner U, Kittner R Cryst. Res. Technol. 22 1431 (1987)
  131. Morozov A N, Bublik V T J. Cryst. Growth 75 491 (1986)
  132. Morozov A N i dr Kristallogr. 28 776 (1983); Morozov A N et al Crystallogr. Rep. 28 458 (1983)
  133. Morozov A N, Abaeva T V, Bublik V T Cryst. Res. Technol. 21 613 (1986)
  134. Bublik V T i dr Izv. AN SSSR. Neorganicheskie Materialy 20 364 (1984)
  135. Boiko V M i dr Fiz. Tekh. Poluprovodn. 40 769 (2006); Boiko V M et al Semiconductors 40 749 (2006)
  136. Bublik V F i dr Kristallogr. 18 353 (1973); Bublik V F Sov. Phys. Crystallogr. 18 218 (1973)
  137. Anastas’eva H A i dr Kristallogr. 23 314 (1978); Anastas’eva N A et al Crystallogr. Rep. 23 174 (1978)
  138. Aref’ev I S i dr Kristallogr. 32 460 (1987); Aref’ev I S Crystallogr. Rep. 32 267 (1987)
  139. Pillukat A, Karsten K, Ehrhart P Phys. Rev. B 53 7823 (1996)
  140. Karsten K, Ehrhart P Phys. Rev. B 51 10508 (1995)
  141. Boiko V M i dr Fiz. Tekh. Poluprovodn. 40 641 (2006); Boiko V M et al Semiconductors 40 621 (2006)
  142. Bublik V F i dr Kristallogr. 22 1240 (1977); Bublik V F Crystallogr. Rep. 22 705 (1977)
  143. Morozov A N, Bublik V F, Koval’chuk I A Kristallogr. 31 986 (1986); Morozov A N, Bublik V F, Kovalchuk I A Crystallogr. Rep. 31 586 (1986)
  144. Gaber A et al J. Appl. Phys. 82 5348 (1997)
  145. Mullin J B et al J. Appl. Phys. 47 2584 (1976)
  146. Gaidai L I i dr Elektronnaya Tekhnika. Cer. 6 2 84 (1979)
  147. Wilke J et al Cryst. Res. Technol. 18 787 (1983)
  148. Bublik V F i dr Kristallogr. 27 1084 (1982); Bublik V F Crystallogr. Rep. 27 621 (1982)
  149. Celotti G, Nobili D, Ostoja P J. Mater. Sci. 9 821 (1974)
  150. Wolcyrz M, Lukaszewicz K J. Appl. Cryst. 15 406 (1982)
  151. Kucytowski J, Wokulska K Cryst. Res. Technol. 40 424 (2005)
  152. Lefeld-Sosnowska M et al J. Phys. D 34 A144 (2001)
  153. Fewster P F, Willoughby A F W J. Cryst. Growth 50 648 (1980)
  154. Fujii K, Okada Y, Orito F J. Appl. Phys. 73 88 (1993)
  155. Kucytowski J, Wokulska K, Kazmierczak-Balata A Thin Solid Films 516 8125 (2008)
  156. Kazmierczak-Balata A et al J. Alloys Comp. 481 622 (2009)
  157. Grosswig S et al Cryst. Res. Technol. 18 K28 (1983)
  158. Pihl C F, Bieber R L, Schwuttke G H Phys. Status Solidi A 17 359 (1973)
  159. Baker T W et al Nature 210 720 (1966)
  160. Baker T W et al AERE-R 5152, Atomic Energy Res. Establ., Harwell (Berkshire, 1969)
  161. Burke J, Tomkeieff M V Acta Cryst. A 24 683 (1968)
  162. Burke J, Tomkeieff M V J. Appl. Cryst. 2 247 (1969)
  163. Gruber E E, Black R E J. Appl. Cryst. 3 354 (1970)
  164. Filscher G, Unangst D Krist. Tech. 15 955 (1980)
  165. Bradaczek H, Leps B, Uebach W Z. Naturforsch. A 37 448 (1982)
  166. Nemiroff M J. Appl. Cryst. 15 375 (1982)
  167. Berger H J. Appl. Cryst. 19 34 (1986)
  168. Grosswig S, Jäckel K-H, Kittner R Cryst. Res. Technol. 21 133 (1986)
  169. Hartwig J, Grosswig S Phys. Status Solidi A 115 369 (1989)
  170. Galdecka E Acta Cryst. A 49 106 (1993)
  171. Galdecka E Acta Cryst. A 49 116 (1993)
  172. Mil’vidskii A M Metody Issledovaniya Struktur Kristallov. Fazovyi Analiz i Pretsizionnye Izmereniya Parametra Reshetki. Lab. Praktikum (M.: Ucheba MISiS, 2005)
  173. Härtwig J et al Phys. Status Solidi A 125 79 (1991)
  174. Shvyd’ko Yu V et al Phys. Rev. Lett. 85 495 (2000)
  175. Pacek P et al Solid State Phenom. 130 73 (2007)
  176. Paszkowski R et al J. Cryst. Growth 401 327 (2014)
  177. Bowen D K, Tanner B K High Resolution X-Ray Diffractometry And Topography (London: Taylor and Francis, 1998); Per. na russk. yaz., Bouen D K, Tanner B K Vysokorazreshayushchaya Rentgenovskaya Difraktometriya i Topografiya (SPb.: Nauka, 2002)
  178. Lider V V Zavodskaya Laboratoriya 74 31 (2008)
  179. Nakayama K et al Z. Naturforsch. A 28 632 (1973)
  180. Zhang X et al J. Appl. Crystallogr. 36 188 (2003)
  181. Blokhin M A, Shveitser I G Rentgenospektral’nyi Spravochnik (M.: Nauka, 1982)
  182. Ando M et al Rev. Sci. Instrum. 60 2410 (1989)
  183. Usuda K et al J. Appl. Phys. 69 182 (1991)
  184. Okada Y et al Nucl. Instrum. Meth. Phys. Res. A 467-468 1037 (2001)
  185. Obaidur R M J. Synchrotron Radiat. 9 28 (2002)
  186. Berger H J. Appl. Cryst. 17 451 (1984)
  187. Soller W Phys. Rev. 24 158 (1924)
  188. Berger H, Christ B, Troschke J Cryst. Res. Technol. 17 1233 (1982)
  189. Härtwig J et al Phys. Status Solidi A 142 19 (1994)
  190. Fewster P F J. Appl. Cryst. 22 64 (1989)
  191. Fewster P F, Andrew N L J. Appl. Cryst. 28 451 (1995)
  192. Fewster P F, Andrew N L J. Phys. D 28 A97 (1995)
  193. Fatemi M Acta Cryst. A 61 301 (2005)
  194. Kohra K, Matsushita T Z. Naturforsch. A 27 484 (1972)
  195. Shvyd’ko Y "X-ray resonators and other applications of Bragg backscattering" Report DESY-THESIS-2002-028 (Hamburg: DESY, 2002)
  196. Shvyd’ko Yu X-Ray Optics. High-Energy-Resolution Applications (Berlin: Springer, 2004)
  197. Lider V V Kristallogr. 57 705 (2012); Lider V V Crystallogr. Rep. 57 628 (2012)
  198. Sykora B, Peisl H Z. Angew. Phys. 30 320 (1970)
  199. Bottom V E, Carvalho R A Rev. Sci. Instrum. 42 196 (1971)
  200. Freund A, Schneider J J. Cryst. Growth 13-14 247 (1972)
  201. Okazaki A, Kawaminami M Jpn. J. Appl. Phys. 12 783 (1973)
  202. Okazaki A, Ohama N J. Appl. Cryst. 12 450 (1979)
  203. Ohama N, Sakashita H, Okazaki A J. Appl. Cryst. 12 455 (1979)
  204. Okazaki A, Soejima Y Acta Cryst. A 57 708 (2001)
  205. Munakata K, Okazaki A Acta Cryst. A 60 33 (2004)
  206. Sakashita H, Ohama N, Okazak A J. Phys. Soc. Jpn. 50 4013 (1981)
  207. Ohama N, Sakashita H, Okazaki A Phase Transit. 4 81 (1984)
  208. Sato M et al Phase Transit. 5 207 (1985)
  209. Soejima Y et al Z. Kristallogr. 195 161 (1991)
  210. Tomonaga N, Soejima Y, Okazaki A Phase Transit. 28 51 (1990)
  211. Onitsuka H et al Phase Transit. 47 93 (1994)
  212. Kohno A et al Nuovo Cimento D 19 293 (1997)
  213. Stetsko Yu P, Kshevetskii S A, Mikhailyuk I P Pis’ma ZhTF 14 29 (1988); Stetsko Yu P, Kshevetskii S A, Mikhailyuk I P Sov. Tech. Phys. Lett. 14 13 (1988)
  214. Shvyd’ko Y V et al J. Synchrotron Radiat. 9 17 (2002)
  215. Lucht M et al J. Appl. Cryst. 36 1075 (2003)
  216. Hastings J B et al Phys. Rev. Lett. 66 770 (1991)
  217. Shvyd’ko Yu V i dr Pis’ma ZhETF 53 69 (1991); Shvyd’ko Yu V et al JETP Lett. 53 69 (1991)
  218. Baron A Q R Hyperfine Interact. 125 29 (2000)
  219. Wille H-C et al Phys. Rev. Lett. 89 285901 (2002)
  220. Hu M Y et al Phys. Rev. B 67 113306 (2003)
  221. Stoupin S, Shvyd’ko Yu V Phys. Rev. Lett. 104 085901 (2010)
  222. Stoupin S, Shvyd’ko Yu V Phys. Rev. B 83 104102 (2011)
  223. Mohr P J, Taylor B N Rev. Mod. Phys. 72 351 (2000)
  224. Toellner T S Hyperfine Interact. 125 3 (2000)
  225. Toellner T S, Alatas A, Said A H J. Synchrotron Radiat. 18 605 (2011)
  226. Isomae S et al J. Appl. Cryst. 9 342 (1976)
  227. Lider V V Kristallogr. 39 406 (1994); Lider V V Crystallogr. Rep. 39 352 (1994)
  228. Zozulya A V, Lider V V, Koval’chuk M V Poverkhnost’. Rentgen., Sinkhrotr. Neitr. Issled. (12) 28 (2002)
  229. Blagov A E i dr Kristallogr. 55 1133 (2010); Blagov A E Crystallogr. Rep. 55 1074 (2010)
  230. Zhang X et al AIP Conf. Proc. 1234 895 (2010)
  231. Fujimoto H, Waseda A, Zhang X W Metrologia 48 S55 (2011)
  232. Waseda A et al IEEE Trans. Instrum. Meas. 64 1692 (2015)
  233. Waseda A et al IEEE Trans. Instrum. Meas. 66 1304 (2017)
  234. Yang J et al AIP Conf. Proc. 2054 060016 (2019)
  235. Terminasov Yu S, Tuzov L V Usp. Fiz. Nauk 83 223 (1964); Terminasov Yu S, Tuzov L V Sov. Phys. Usp. 7 434 (1964)
  236. Chang S-L Multiple Diffraction Of X-Rays In Crystals (Berlin: Springer-Verlag, 1984); Per. na russk. yaz., Chzhan Sh Mnogovolnovaya Difraktsiya Rentgenovskikh Luchei v Kristallakh (M.: Mir, 1987)
  237. Yang C-Z, Hao J-M, Pei G-W Rigaku J. 17 46 (2000)
  238. Renninger M Z. Phys. 106 141 (1937)
  239. Cole H, Chambers F H, Dunn H M Acta Cryst. 15 138 (1962)
  240. Post B J. Appl. Cryst. 8 452 (1975)
  241. Rossmanith E J. Appl. Cryst. 32 355 (1999)
  242. Rossmanith E J. Appl. Cryst. 36 1467 (2003)
  243. Kshevetskii S A i dr Ukr. Fiz. Zhurn. 24 1480 (1979)
  244. Kshevetskii S A i dr Ukr. Fiz. Zhurn. 30 1843 (1985)
  245. Borcha M et al Proc. SPIE 7008 700819 (2008)
  246. Hom T, Kiszenik W, Post B J. Appl. Cryst. 8 457 (1975)
  247. Sasaki J M et al J. Cryst. Growth 172 284 (1997)
  248. Morelhão S L et al Microelectron. J. 36 219 (2005)
  249. Freitas R O et al Phys. Status Solidi A 204 2548 (2007)
  250. Avanci L H et al Phys. Rev. B 61 6507 (2000)
  251. Hart M Proc. R. Soc. Lond. A 346 1 (1975)
  252. Siddons D P AIP Conf. Proc. 75 236 (1981)
  253. Lider V V Usp. Fiz. Nauk 184 1217 (2014); Lider V V Phys. Usp. 57 1099 (2014)
  254. Cavagnero G et al Metrologia 41 56 (2004)
  255. Hart M Brit. J. Appl. Phys. 1 1405 (1968)
  256. Hart M, Siddons D P Proc. R. Soc. Lond. A 376 465 (1980)
  257. Bonse U, Lotsch H, Henning A J. X-Ray Sci. Technol. 1 107 (1989)
  258. Baker J F C, Hart M Acta Cryst. A 31 364 (1975)
  259. Deslattes R D Appl. Phys. Lett. 15 386 (1969)
  260. Deslattes R D, Henins A Phys. Rev. Lett. 31 972 (1973)
  261. Basile G et al IEEE Trans. Instrum. Meas. 38 210 (1989)
  262. Bergamin A et al Eur. Phys. J. B 9 225 (1999)
  263. Schwarzenberger D R, Chetwynd D G, Bowen D K J. X-Ray Sci. Technol. 1 134 (1989)
  264. Yacoot A, Kuetgens U Meas. Sci. Technol. 23 074003 (2012)
  265. Bonse U, te Kaat E Z. Phys. 214 16 (1968)
  266. Becker P, Mana G Metrologia 31 203 (1994)
  267. Ferroglio L, Mana G, Massa E Opt. Express 16 16877 (2008)
  268. Massa E et al Metrologia 48 S37 (2011)
  269. Massa E et al J. Phys. Chem. Ref. Data 44 031208 (2015)
  270. Fujii K et al Metrologia 55 L1 (2018)
  271. Quagliotti D et al Metrologia 50 243 (2013)
  272. Melis C et al Metrologia 53 1339 (2016)
  273. Buschert R C Bull. Am. Phys. Soc. 10 125 (1965)
  274. Hart M Proc. R. Soc. Lond. A 309 281 (1969)
  275. Buschert R C et al J. Appl. Cryst. 16 599 (1983)
  276. Ando M, Bailey D, Hart M Acta Cryst. A 34 484 (1978)
  277. Häusermann D, Hart M J. Appl. Cryst. 23 63 (1990)
  278. Koval’chuk M V, Kov’ev E K, Pinsker Z G Kristallogr. 20 142 (1975); Koval’chuk M V, Kov’ev E K, Pinsker Z G Sov. Phys. Crystallogr. 20 81 (1975)
  279. Buschert R C et al Phys. Rev. B 38 5219 (1988)
  280. Larson B C J. Appl. Phys. 45 514 (1974)
  281. Baker J F C et al Solid-State Electron. 19 331 (1976)
  282. Cembali F et al J. Appl. Cryst. 25 424 (1992)
  283. Kishino S Adv. X-Ray Anal. 16 367 (1973)
  284. Popovic S J. Appl. Cryst. 4 240 (1971)
  285. Fukumori T, Futagami K, Matsunaga K Jpn. J. Appl. Phys. 21 1525 (1982)
  286. Fukumori T, Futagami K Jpn. J. Appl. Phys. 27 442 (1988)
  287. Fukumori T et al J. Phys. Soc. Jpn. 66 1976 (1997)
  288. Becker P, Scyfried P, Siegert H Z. Phys. B 48 17 (1982)
  289. Siegert H, Becker P, Seyfried P Z. Phys. B 56 273 (1984)
  290. Kubena J, Holý V J. Appl. Cryst. 21 245 (1988)
  291. Kessler E G et al J. Res. Natl. Inst. Stand. Technol. 99 1 (1994)
  292. Martin J et al Metrologia 35 811 (1998)
  293. Kessler E G et al IEEE Trans. Instrum. Meas. 48 221 (1999)
  294. Mana G, Palmisano C, Zosi G J. Appl. Cryst. 37 773 (2004)
  295. Hanke M, Kessler E G J. Phys. 38 A117 (2005)
  296. Kessler E G et al J. Res. Natl. Inst. Stand. Technol. 122 1 (2017)
  297. Bonse U et al Phys. Status Solidi A 43 487 (1977)
  298. Massa E et al Metrologia 48 S44 (2011)
© 1918–2024 Uspekhi Fizicheskikh Nauk
Email: ufn@ufn.ru Editorial office contacts About the journal Terms and conditions