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Multilayer X-ray interference structures


Shubnikov Institute of Crystallography, Russian Academy of Sciences, Leninskii prosp. 59, Moscow, 119333, Russian Federaion

Functional principles, state of the art, and issues of multilayer X-ray optics are reviewed. Methods to optimize planar multilayer interference structures and multilayer diffraction gratings and their application in academic research and technology are discussed.

Keywords: multilayer systems, diffraction gratings, X-rays, X-ray optics, diffraction, interference, spectral resolution
PACS: 07.85.−m, 41.50.+h, 42.79.Dj, 42.88.+h, 61.05.cp, 78.20.Bh, 78.67.Pt, 95.55.Ka (all)
DOI: 10.3367/UFNe.2018.10.038439
URL: https://ufn.ru/en/articles/2019/11/a/
Citation: Lider V V "Multilayer X-ray interference structures" Phys. Usp. 62 1063–1095 (2019)
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Received: 12th, July 2018, revised: 24th, September 2018, 4th, October 2018

Оригинал: Лидер В В «Многослойные рентгеновские интерференционные структуры» УФН 189 1137–1171 (2019); DOI: 10.3367/UFNr.2018.10.038439

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