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Multilayer X-ray interference structures


Shubnikov Institute of Crystallography, Russian Academy of Sciences, Leninskii prosp. 59, Moscow, 119333, Russian Federaion

Functional principles, state of the art, and issues of multilayer X-ray optics are reviewed. Methods to optimize planar multilayer interference structures and multilayer diffraction gratings and their application in academic research and technology are discussed.

Typically, an English fulltext is available in about 3 months from the date of publication of the original article.

Keywords: multilayer systems, diffraction gratings, X-rays, X-ray optics, diffraction, interference, spectral resolution
PACS: 07.85.−m, 41.50.+h, 42.79.Dj, 42.88.+h, 61.05.cp, 78.20.Bh, 78.67.Pt, 95.55.Ka (all)
DOI: 10.3367/UFNe.2018.10.038439
URL: https://ufn.ru/en/articles/2019/11/a/
Citation: Lider V V "Multilayer X-ray interference structures" Phys. Usp. 62 1063–1095 (2019)
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Received: 12th, July 2018, revised: 24th, September 2018, 4th, October 2018

Оригинал: Лидер В В «Многослойные рентгеновские интерференционные структуры» УФН 189 1137–1171 (2019); DOI: 10.3367/UFNr.2018.10.038439

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