Precise determination of crystal lattice parameters
V.V. Lider Federal Scientific Research Center "Crystallography and Photonics", Russian Academy of Sciences, Shubnikov Institute of Crystallography, Russian Academy of Sciences, Leninskii prosp. 59, Moscow, 119333, Russian Federaion
Precision X-ray methods for absolute and relative determination of crystal lattice parameters (interplanar distances) are described and compared, including the X-ray divergent-beam (Kossel) technique, the Bond method, the Renninger method, the back reflection method, the interference method, and the method of standards. It is shown that for most of the considered methods, a relative accuracy of ~10−5—10−6 for determining the lattice parameters is usually achievable, with the last two methods giving a much greater accuracy, at the level of ~10−8—10−9.
PT Journal Article
TI Precise determination of crystal lattice parameters
AU Lider V V
FAU Lider VV
DP 10 Sep, 2020
TA Phys. Usp.
SO Phys. Usp. 2020 Sep 10;63(9):907-928
Received: 14th, May 2019, revised: 1st, July 2019, accepted: 2nd, July 2019