68.37.Ef Scanning tunneling microscopy (including chemistry induced with STM)
81.07.Ta Quantum dots
81.15.Hi Molecular, atomic, ion, and chemical beam epitaxy
P.I. Arseev, V.N. Mantsevich et al “Tunneling features in semiconductor nanostructures ” 60 1067–1086 (2017)
05.60.Gg , 68.37.Ef , 73.40.Gk , 73.63.−b (all )
L.V. Arapkina, V.A. Yuryev “Classification of Ge hut clusters in arrays formed by molecular beam epitaxy at low temperatures on the Si(001) surface ” 53 279–290 (2010)
68.37.Ef , 81.07.Ta , 81.15.Hi (all )
A.A. Shklyaev, M. Ichikawa “Fabrication of germanium and silicon nanostructures using a scanning tunneling microscope ” 49 887–903 (2006)
68.37.Ef , 79.70.+q , 81.16.Ta (all )
V.S. Edel’man “Scanning tunnel microscopy and spectroscopy of an atomically clean bismuth surface ” 48 1057–1061 (2005)
65.35.-p, 68.37.−d , 68.37.Ef (all )
O.P. Pchelyakov “Molecular beam epitaxy: equipment, devices, technology ” 43 923–925 (2000)
07.07.−a , 81.15.Hi , 85.30.−z (all )
A.V. Latyshev, A.L. Aseev “Monatomic steps on silicon surfaces ” 41 1015–1023 (1998)
68.35.p, 68.55.a, 81.15.Hi
N.S. Maslova “Chemistry and physics of solid surfaces ” 34 (4) 359–359 (1991)
68.37.Ef , 68.37.Ps , 68.47.Fg (all )
V.S. Edel’man “The development of scanning tunneling microscopy ” 34 (3) 272–273 (1991)
07.79.Cz , 68.37.Ef , 72.40.+w , 78.55.Cr , 74.72.Bk , 78.67.Pt (all )
V.I. Panov “Scanning tunneling microscopy and surface spectroscopy ” 31 471–473 (1988)
68.37.Ef , 66.30.Fq , 68.35.Bs , 68.47.De , 73.20.At (all )
M.S. Khaikin “Scanning tunneling microscopy and spectroscopy ” 31 473–474 (1988)
68.37.Ef , 73.30.+y , 68.35.Bs , 74.72.Bk , 74.50.+r (all )
V.M. Svistunov, M.A. Belogolovskii, A.I. D’yachenko “Vacuum tunneling microscopy and spectroscopy ” 31 86–89 (1988)
07.79.Cz , 01.10.Cr , 68.37.Ef , 68.35.Bs , 74.25.Jb , 74.50.+r (all )
O.P. Zaskal’ko “Picosecond electronics and optoelectronics ” 30 350–350 (1987)
01.30.Vv , 01.30.Ee , 85.60.−q , 85.30.−z , 81.15.Gh , 81.15.Hi (all )
I.P. Revokatova, A.P. Silin “Scanning tunneling microscopy: new method for studying solid surfaces ” 27 76–78 (1984)
07.79.Cz , 68.37.Ef (all )