PACS numbers

68.37.Ef Scanning tunneling microscopy (including chemistry induced with STM) 81.07.Ta Quantum dots 81.15.Hi Molecular, atomic, ion, and chemical beam epitaxy
  1. P.I. Arseev, V.N. Mantsevich et alTunneling features in semiconductor nanostructures60 1067–1086 (2017)
    05.60.Gg, 68.37.Ef, 73.40.Gk, 73.63.−b (all)
  2. L.V. Arapkina, V.A. Yuryev “Classification of Ge hut clusters in arrays formed by molecular beam epitaxy at low temperatures on the Si(001) surface53 279–290 (2010)
    68.37.Ef, 81.07.Ta, 81.15.Hi (all)
  3. A.A. Shklyaev, M. Ichikawa “Fabrication of germanium and silicon nanostructures using a scanning tunneling microscope49 887–903 (2006)
    68.37.Ef, 79.70.+q, 81.16.Ta (all)
  4. V.S. Edel’man “Scanning tunnel microscopy and spectroscopy of an atomically clean bismuth surface48 1057–1061 (2005)
    65.35.-p, 68.37.−d, 68.37.Ef (all)
  5. O.P. Pchelyakov “Molecular beam epitaxy: equipment, devices, technology43 923–925 (2000)
    07.07.−a, 81.15.Hi, 85.30.−z (all)
  6. A.V. Latyshev, A.L. Aseev “Monatomic steps on silicon surfaces41 1015–1023 (1998)
    68.35.p, 68.55.a, 81.15.Hi
  7. N.S. Maslova “Chemistry and physics of solid surfaces34 (4) 359–359 (1991)
    68.37.Ef, 68.37.Ps, 68.47.Fg (all)
  8. V.S. Edel’man “The development of scanning tunneling microscopy34 (3) 272–273 (1991)
    07.79.Cz, 68.37.Ef, 72.40.+w, 78.55.Cr, 74.72.Bk, 78.67.Pt (all)
  9. V.I. Panov “Scanning tunneling microscopy and surface spectroscopy31 471–473 (1988)
    68.37.Ef, 66.30.Fq, 68.35.Bs, 68.47.De, 73.20.At (all)
  10. M.S. Khaikin “Scanning tunneling microscopy and spectroscopy31 473–474 (1988)
    68.37.Ef, 73.30.+y, 68.35.Bs, 74.72.Bk, 74.50.+r (all)
  11. V.M. Svistunov, M.A. Belogolovskii, A.I. D’yachenko “Vacuum tunneling microscopy and spectroscopy31 86–89 (1988)
    07.79.Cz, 01.10.Cr, 68.37.Ef, 68.35.Bs, 74.25.Jb, 74.50.+r (all)
  12. O.P. Zaskal’ko “Picosecond electronics and optoelectronics30 350–350 (1987)
    01.30.Vv, 01.30.Ee, 85.60.−q, 85.30.−z, 81.15.Gh, 81.15.Hi (all)
  13. I.P. Revokatova, A.P. Silin “Scanning tunneling microscopy: new method for studying solid surfaces27 76–78 (1984)
    07.79.Cz, 68.37.Ef (all)
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