68.37.Ef Scanning tunneling microscopy (including chemistry induced with STM) 68.37.Ps Atomic force microscopy (AFM) 68.47.Fg Semiconductor surfaces

P.I. Arseev, V.N. Mantsevich et al “Tunneling features in semiconductor nanostructures” 60 1067–1086 (2017)
05.60.Gg, 68.37.Ef, 73.40.Gk, 73.63.−b (all)
D.V. Kazantsev, E.V. Kuznetsov et al “Apertureless near-field optical microscopy” 60 259–275 (2017)
07.60.−j, 07.79.Fc, 61.46.−w, 68.37.Ps, 68.65.Pq, 85.30.De, 87.64.−t (all)
L.V. Arapkina, V.A. Yuryev “Classification of Ge hut clusters in arrays formed by molecular beam epitaxy at low temperatures on the Si(001) surface” 53 279–290 (2010)
68.37.Ef, 81.07.Ta, 81.15.Hi (all)
A.A. Shklyaev, M. Ichikawa “Fabrication of germanium and silicon nanostructures using a scanning tunneling microscope” 49 887–903 (2006)
68.37.Ef, 79.70.+q, 81.16.Ta (all)
V.S. Edel’man “Scanning tunnel microscopy and spectroscopy of an atomically clean bismuth surface” 48 1057–1061 (2005)
65.35.-p, 68.37.−d, 68.37.Ef (all)
N.S. Maslova “Chemistry and physics of solid surfaces” 34 (4) 359–359 (1991)
68.37.Ef, 68.37.Ps, 68.47.Fg (all)
V.S. Edel’man “The development of scanning tunneling microscopy” 34 (3) 272–273 (1991)
07.79.Cz, 68.37.Ef, 72.40.+w, 78.55.Cr, 74.72.Bk, 78.67.Pt (all)
I.N. Sisakyan, A.B. Shvartsburg “Adaptive radiooptics” 31 470–471 (1988)
42.79.Hp, 42.79.Ci, 72.30.+q, 72.20.Ht, 72.20.Jv, 68.47.Fg (all)
V.I. Panov “Scanning tunneling microscopy and surface spectroscopy” 31 471–473 (1988)
68.37.Ef, 66.30.Fq, 68.35.Bs, 68.47.De, 73.20.At (all)
M.S. Khaikin “Scanning tunneling microscopy and spectroscopy” 31 473–474 (1988)
68.37.Ef, 73.30.+y, 68.35.Bs, 74.72.Bk, 74.50.+r (all)
V.M. Svistunov, M.A. Belogolovskii, A.I. D’yachenko “Vacuum tunneling microscopy and spectroscopy” 31 86–89 (1988)
07.79.Cz, 01.10.Cr, 68.37.Ef, 68.35.Bs, 74.25.Jb, 74.50.+r (all)
V.A. Grazhulis “Low-temperature investigations of surfaces of certain semiconductors” 30 745–745 (1987)
68.35.Bs, 68.47.Fg, 68.43.−h, 79.60.Bm, 68.49.Jk, 61.14.Hg (all)
S.A. Akhmanov, V.I. Emel’yanov et al “Interaction of powerful laser radiation with the surfaces of semiconductors and metals: nonlinear optical effects and nonlinear optical diagnostics” 28 1084–1124 (1985)
61.80.Ba, 68.47.De, 68.47.Fg, 64.70.Kb, 68.35.Rh, 78.35.+c (all)
I.P. Revokatova, A.P. Silin “Scanning tunneling microscopy: new method for studying solid surfaces” 27 76–78 (1984)
07.79.Cz, 68.37.Ef (all)
E.Ya. Zandberg, N.I. Ionov “Surface ionization” 2 255–281 (1959)
73.30.+y, 79.70.+q, 68.47.De, 68.47.Fg, 68.35.Md, 73.20.At (all)
D.V. Kazantsev, E.A. Kazantseva “Scattering type apertureless scaning near-field optical microscopy”, accepted
07.79.Fc, 68.37.Ps, 07.60.−j, 87.64.Je, 61.46.+w, 85.30.De, 68.65.Pq (all)

PACS numbers