PACS numbers

68.37.Ef Scanning tunneling microscopy (including chemistry induced with STM) 68.37.Ps Atomic force microscopy (AFM) 68.47.Fg Semiconductor surfaces
  1. P.I. Arseev, V.N. Mantsevich et alTunneling features in semiconductor nanostructures60 1067–1086 (2017)
    05.60.Gg, 68.37.Ef, 73.40.Gk, 73.63.−b (all)
  2. D.V. Kazantsev, E.V. Kuznetsov et alApertureless near-field optical microscopy60 259–275 (2017)
    07.60.−j, 07.79.Fc, 61.46.−w, 68.37.Ps, 68.65.Pq, 85.30.De, 87.64.−t (all)
  3. L.V. Arapkina, V.A. Yuryev “Classification of Ge hut clusters in arrays formed by molecular beam epitaxy at low temperatures on the Si(001) surface53 279–290 (2010)
    68.37.Ef, 81.07.Ta, 81.15.Hi (all)
  4. A.A. Shklyaev, M. Ichikawa “Fabrication of germanium and silicon nanostructures using a scanning tunneling microscope49 887–903 (2006)
    68.37.Ef, 79.70.+q, 81.16.Ta (all)
  5. V.S. Edel’man “Scanning tunnel microscopy and spectroscopy of an atomically clean bismuth surface48 1057–1061 (2005)
    65.35.-p, 68.37.−d, 68.37.Ef (all)
  6. N.S. Maslova “Chemistry and physics of solid surfaces34 (4) 359–359 (1991)
    68.37.Ef, 68.37.Ps, 68.47.Fg (all)
  7. V.S. Edel’man “The development of scanning tunneling microscopy34 (3) 272–273 (1991)
    07.79.Cz, 68.37.Ef, 72.40.+w, 78.55.Cr, 74.72.Bk, 78.67.Pt (all)
  8. I.N. Sisakyan, A.B. Shvartsburg “Adaptive radiooptics31 470–471 (1988)
    42.79.Hp, 42.79.Ci, 72.30.+q, 72.20.Ht, 72.20.Jv, 68.47.Fg (all)
  9. V.I. Panov “Scanning tunneling microscopy and surface spectroscopy31 471–473 (1988)
    68.37.Ef, 66.30.Fq, 68.35.Bs, 68.47.De, 73.20.At (all)
  10. M.S. Khaikin “Scanning tunneling microscopy and spectroscopy31 473–474 (1988)
    68.37.Ef, 73.30.+y, 68.35.Bs, 74.72.Bk, 74.50.+r (all)
  11. V.M. Svistunov, M.A. Belogolovskii, A.I. D’yachenko “Vacuum tunneling microscopy and spectroscopy31 86–89 (1988)
    07.79.Cz, 01.10.Cr, 68.37.Ef, 68.35.Bs, 74.25.Jb, 74.50.+r (all)
  12. V.A. Grazhulis “Low-temperature investigations of surfaces of certain semiconductors30 745–745 (1987)
    68.35.Bs, 68.47.Fg, 68.43.−h, 79.60.Bm, 68.49.Jk, 61.14.Hg (all)
  13. S.A. Akhmanov, V.I. Emel’yanov et alInteraction of powerful laser radiation with the surfaces of semiconductors and metals: nonlinear optical effects and nonlinear optical diagnostics28 1084–1124 (1985)
    61.80.Ba, 68.47.De, 68.47.Fg, 64.70.Kb, 68.35.Rh, 78.35.+c (all)
  14. I.P. Revokatova, A.P. Silin “Scanning tunneling microscopy: new method for studying solid surfaces27 76–78 (1984)
    07.79.Cz, 68.37.Ef (all)
  15. E.Ya. Zandberg, N.I. Ionov “Surface ionization2 255–281 (1959)
    73.30.+y, 79.70.+q, 68.47.De, 68.47.Fg, 68.35.Md, 73.20.At (all)
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