PACS numbers

68.37.Ef Scanning tunneling microscopy (including chemistry induced with STM) 79.70.+q Field emission, ionization, evaporation, and desorption 81.16.Ta Atom manipulation
  1. E.D. Eidelman, A.V. Arkhipov “Field emission from carbon nanostructures: models and experiment63 648–667 (2020)
    71.38.Ht, 73.63.−b, 79.70.+q (all)
  2. P.I. Arseev, V.N. Mantsevich et alTunneling features in semiconductor nanostructures60 1067–1086 (2017)
    05.60.Gg, 68.37.Ef, 73.40.Gk, 73.63.−b (all)
  3. A.S. Bugaev, P.A. Eroshkin et alLow-power X-ray tubes: the current status56 691–703 (2013)
    07.85.Fv, 41.50.+h, 79.70.+q (all)
  4. A.D. Pogrebnjak, A.G. Ponomarev et alApplication of micro- and nanoprobes to the analysis of small-sized 3D materials, nanosystems, and nanoobjects55 270–300 (2012)
    07.78.+s, 78.70.Bj, 81.16.Ta, 81.40.−z (all)
  5. L.V. Arapkina, V.A. Yuryev “Classification of Ge hut clusters in arrays formed by molecular beam epitaxy at low temperatures on the Si(001) surface53 279–290 (2010)
    68.37.Ef, 81.07.Ta, 81.15.Hi (all)
  6. V.I. Balykin “Parallel fabrication of nanostructures via atom projection50 744–749 (2007)
    01.10.Fv, 81.07.−b, 81.16.−c, 81.16.Ta (all)
  7. N.M. Blashenkov, G.Ya. Lavrent’ev “Surface-ionization field mass-spectrometry studies of nonequilibrium surface ionization50 53–78 (2007)
    33.80.Eh, 36.20.−r, 68.43.−h, 79.70.+q (all)
  8. A.A. Shklyaev, M. Ichikawa “Fabrication of germanium and silicon nanostructures using a scanning tunneling microscope49 887–903 (2006)
    68.37.Ef, 79.70.+q, 81.16.Ta (all)
  9. V.S. Edel’man “Scanning tunnel microscopy and spectroscopy of an atomically clean bismuth surface48 1057–1061 (2005)
    65.35.-p, 68.37.−d, 68.37.Ef (all)
  10. A.T. Rakhimov “Autoemission cathodes (cold emitters) on nanocrystalline carbon and nanodiamond films: physics, technology, applications43 926–929 (2000)
    79.60.Jv, 79.70.+q, 85.45.−w, 85.60.Pg (all)
  11. N.S. Maslova “Chemistry and physics of solid surfaces34 (4) 359–359 (1991)
    68.37.Ef, 68.37.Ps, 68.47.Fg (all)
  12. V.S. Edel’man “The development of scanning tunneling microscopy34 (3) 272–273 (1991)
    07.79.Cz, 68.37.Ef, 72.40.+w, 78.55.Cr, 74.72.Bk, 78.67.Pt (all)
  13. V.I. Panov “Scanning tunneling microscopy and surface spectroscopy31 471–473 (1988)
    68.37.Ef, 66.30.Fq, 68.35.Bs, 68.47.De, 73.20.At (all)
  14. M.S. Khaikin “Scanning tunneling microscopy and spectroscopy31 473–474 (1988)
    68.37.Ef, 73.30.+y, 68.35.Bs, 74.72.Bk, 74.50.+r (all)
  15. V.M. Svistunov, M.A. Belogolovskii, A.I. D’yachenko “Vacuum tunneling microscopy and spectroscopy31 86–89 (1988)
    07.79.Cz, 01.10.Cr, 68.37.Ef, 68.35.Bs, 74.25.Jb, 74.50.+r (all)
  16. I.P. Revokatova, A.P. Silin “Scanning tunneling microscopy: new method for studying solid surfaces27 76–78 (1984)
    07.79.Cz, 68.37.Ef (all)
  17. M.D. Gabovich “Liquid-metal ion emitters26 447–455 (1983)
  18. S.A. Azimov, Yu.K. Vishchakas et alÉmmanuil ll’ich Adirovich (obituary)18 810–811 (1975)
    01.60.+q, 79.40.+z, 79.70.+q (all)
  19. S.P. Bugaev, E.A. Litvinov et alExplosive emission of electrons18 51–61 (1975)
    79.40.+z, 79.70.+q, 82.45.Fk (all)
  20. B.Yu. Mirgorodskii, D.Ya. Kostyukevich, D.A. Makarchenko “Demonstration microscope with field emission16 553–556 (1974)
    07.78.+s, 79.70.+q (all)
  21. A.L. Suvorov, V.V. Trebukhovskii “Mass analysis and field-ion microscopy15 471–485 (1973)
    79.70.+q, 68.37.Vj, 32.80.Dz (all)
  22. V.A. Tsukerman, L.V. Tarasova, S.I. Lobov “New sources of X Rays14 61–71 (1971)
    07.85.Fv, 79.70.+q (all)
  23. E.M. Nadgornyĭ “The properties of whiskers5 462–477 (1962)
    68.70.+w, 81.40.Jj, 81.40.Lm, 61.72.Hh, 75.60.Ch, 79.70.+q (all)
  24. E.Ya. Zandberg, N.I. Ionov “Surface ionization2 255–281 (1959)
    73.30.+y, 79.70.+q, 68.47.De, 68.47.Fg, 68.35.Md, 73.20.At (all)
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