07.78.+s Electron, positron, and ion microscopes; electron diffractometers
61.72.Ff Direct observation of dislocations and other defects (etch pits, decoration, electron microscopy, x-ray topography, etc.)
68.37.Hk Scanning electron microscopy (SEM) (including EBIC)
78.60.Hk Cathodoluminescence, ionoluminescence
87.64.Ee Electron microscopy
I.G. Dyachkova, D.A. Zolotov et al “Potential of the microwave method for the activation of carbon materials in comparison with the traditional thermal method ” 66 1248–1257 (2023)
61.05.C− , 68.37.Hk , 68.37.Lp , 78.70.Gq (all )
S.A. Aseyev, A.S. Akhmanov et al “Structural dynamics of free molecules and condensed matter ” 63 103–122 (2020)
07.78.+s , 42.65.Re , 61.05.J− (all )
T.S. Argunova, V.G. Kohn “Study of micropores in single crystals by in-line phase contrast imaging with synchrotron radiation ” 62 602–616 (2019)
42.25.Fx , 42.25.Kb , 61.72.−y , 61.72.Ff , 61.72.Lk (all )
S.A. Aseyev, E.A. Ryabov “Investigation of structural dynamics of substances using ultrafast electron diffraction and microscopy ” 62 289–293 (2019)
07.78.+s , 61.05.J− , 64.70.D− , 64.70.K− , 68.37.Og (all )
V.I. Karas’, V.I. Sokolenko “Nonequilibrium kinetics of the electron—phonon subsystem can give rise to electric- and magnetic-plasticity effects in crystals in alternating electric and/or magnetic fields ” 61 1051–1071 (2018)
61.72.Ff , 61.72.Hh , 62.20.Hg , 63.20.kd , 63.20.kp , 75.80.+q , 83.60.Np (all )
E.V. Suvorov, I.A. Smirnova “X-ray diffraction imaging of defects in topography (microscopy) studies ” 58 833–849 (2015)
61.05.C− , 61.72.Dd , 61.72.Ff (all )
A.A. Ishchenko, S.A. Aseev et al “Ultrafast electron diffraction and electron microscopy: present status and future prospects ” 57 633–669 (2014)
07.78.+s , 61.05.J− , 64.70.D− , 64.70.K− , 68.37.Og (all )
A.D. Pogrebnjak, A.G. Ponomarev et al “Application of micro- and nanoprobes to the analysis of small-sized 3D materials, nanosystems, and nanoobjects ” 55 270–300 (2012)
07.78.+s , 78.70.Bj , 81.16.Ta , 81.40.−z (all )
B.M. Smirnov “Processes involving clusters and small particles in a buffer gas ” 54 691–721 (2011)
36.40.−c , 36.40.Sx , 61.43.Hv , 64.70.D− , 68.37.Hk (all )
N.S. Maslova, V.I. Panov “Scanning tunneling microscopy of atomic structure, electronic properties, and surface chemical reactions ” 32 93–99 (1989)
68.37.Hk , 68.35.Bs , 73.20.At , 68.43.−h , 82.65.+r (all )
A.A. Chernov “Elementary processes of crystal growth from solutions ” 30 1098–1100 (1987)
81.10.Dn , 61.72.Ff , 77.84.Fa , 68.35.Fx (all )
V.G. Dyukov “Scanning electron microscopy ” 30 552–552 (1987)
68.37.Hk
B.K. Vainshtein “Electron microscopy at atomic resolution ” 30 393–419 (1987)
07.78.+s , 68.37.Lp , 61.66.−f (all )
G.V. Spivak, V.I. Petrov, M.K. Antoshin “Local cathodoluminescence and its capabilities for the study of band structure in solids ” 29 364–380 (1986)
78.60.Hk , 71.20.Nr , 68.55.Ln , 73.50.−h (all )
V.S. Vavilov “Some physical aspects of ion implantation ” 28 196–206 (1985)
81.15.Cd , 68.55.Ln , 68.55.Nq , 78.55.−m , 78.60.Hk , 78.66.Jg (all )
A.A. Lebedev “Fragments from recollections of S. I. Vavilov ” 17 958–959 (1975)
07.78.+s , 07.60.Pb , 01.60.+q (all )
G.V. Spivak, G.V. Saparin, M.K. Antoshin “Color contrast in scanning electron microscopy ” 17 593–595 (1975)
68.37.Hk , 78.60.Hk , 07.68.+m (all )
A.E. Luk’yanov, G.V. Spivak, R.S. Gvozdover “Mirror electron microscopy ” 16 529–552 (1974)
07.78.+s , 68.37.−d (all )
B.Yu. Mirgorodskii, D.Ya. Kostyukevich, D.A. Makarchenko “Demonstration microscope with field emission ” 16 553–556 (1974)
07.78.+s , 79.70.+q (all )
B.K. Vainshtein “Three-dimensional electron microscopy of biological macromolecules ” 16 185–206 (1973)
87.64.Ee , 36.20.Ey , 87.14.Ee , 87.15.By (all )
G.V. Spivak, G.V. Saparin, M.V. Bykov “Scanning electron microscopy ” 12 756–776 (1970)
07.78.+s , 68.37.Hk , 78.60.Hk , 61.72.Ff , 87.64.Ee (all )
N.D. Zhevandrov “Vadim Leonidovich Levshin (obituary) ” 13 421–423 (1970)
01.60.+q , 78.55.−m , 78.60.Hk (all )
R.F. Vasil’ev “Chemiluminescence in solutions ” 9 504–524 (1967)
78.60.Ps , 82.20.Pm , 82.30.−b , 78.60.Hk (all )
V.I. Milyutin “Electron interference and phase microscopy ” 4 576–583 (1962)
07.78.+s
L.G. Orlov, M.P. Usikov, L.M. Utevskii “Electron-microscope observation of dislocations in metals ” 5 53–78 (1962)
61.72.Ff , 61.72.Ji , 61.72.Nn (all )
E.Yu. Kokorish, N.N. Sheftal’ “Dislocations in semiconductor crystals ” 3 840–849 (1961)
61.72.Bb , 61.72.Ff , 62.20.Fe , 71.20.Mq , 72.20.Jv , 61.72.Ss (all )
D.M. Vasil’ev, B.I. Smirnov “Certain X-RAY diffraction methods of investigating cold worked metals ” 4 226–259 (1961)
61.10.Nz , 62.20.Fe , 61.72.Nn , 61.66.Bi , 61.72.Ff (all )