PACS numbers

07.78.+s Electron, positron, and ion microscopes; electron diffractometers 61.72.Ff Direct observation of dislocations and other defects (etch pits, decoration, electron microscopy, x-ray topography, etc.) 68.37.Hk Scanning electron microscopy (SEM) (including EBIC) 78.60.Hk Cathodoluminescence, ionoluminescence 87.64.Ee Electron microscopy
  1. T.S. Argunova, V.G. Kohn “Study of micropores in single crystals by in-line phase contrast imaging with synchrotron radiation62 602–616 (2019)
    42.25.Fx, 42.25.Kb, 61.72.−y, 61.72.Ff, 61.72.Lk (all)
  2. S.A. Aseyev, E.A. Ryabov “Investigation of structural dynamics of substances using ultrafast electron diffraction and microscopy62 289–293 (2019)
    07.78.+s, 61.05.J−, 64.70.D−, 64.70.K−, 68.37.Og (all)
  3. V.I. Karas’, V.I. Sokolenko “Nonequilibrium kinetics of the electron—phonon subsystem can give rise to electric- and magnetic-plasticity effects in crystals in alternating electric and/or magnetic fields61 1051–1071 (2018)
    61.72.Ff, 61.72.Hh, 62.20.Hg, 63.20.kd, 63.20.kp, 75.80.+q, 83.60.Np (all)
  4. E.V. Suvorov, I.A. Smirnova “X-ray diffraction imaging of defects in topography (microscopy) studies58 833–849 (2015)
    61.05.C−, 61.72.Dd, 61.72.Ff (all)
  5. A.A. Ishchenko, S.A. Aseev et alUltrafast electron diffraction and electron microscopy: present status and future prospects57 633–669 (2014)
    07.78.+s, 61.05.J−, 64.70.D−, 64.70.K−, 68.37.Og (all)
  6. A.D. Pogrebnjak, A.G. Ponomarev et alApplication of micro- and nanoprobes to the analysis of small-sized 3D materials, nanosystems, and nanoobjects55 270–300 (2012)
    07.78.+s, 78.70.Bj, 81.16.Ta, 81.40.−z (all)
  7. B.M. Smirnov “Processes involving clusters and small particles in a buffer gas54 691–721 (2011)
    36.40.−c, 36.40.Sx, 61.43.Hv, 64.70.D−, 68.37.Hk (all)
  8. N.S. Maslova, V.I. Panov “Scanning tunneling microscopy of atomic structure, electronic properties, and surface chemical reactions32 93–99 (1989)
    68.37.Hk, 68.35.Bs, 73.20.At, 68.43.−h, 82.65.+r (all)
  9. A.A. Chernov “Elementary processes of crystal growth from solutions30 1098–1100 (1987)
    81.10.Dn, 61.72.Ff, 77.84.Fa, 68.35.Fx (all)
  10. V.G. Dyukov “Scanning electron microscopy30 552–552 (1987)
    68.37.Hk
  11. B.K. Vainshtein “Electron microscopy at atomic resolution30 393–419 (1987)
    07.78.+s, 68.37.Lp, 61.66.−f (all)
  12. G.V. Spivak, V.I. Petrov, M.K. Antoshin “Local cathodoluminescence and its capabilities for the study of band structure in solids29 364–380 (1986)
    78.60.Hk, 71.20.Nr, 68.55.Ln, 73.50.−h (all)
  13. V.S. Vavilov “Some physical aspects of ion implantation28 196–206 (1985)
    81.15.Cd, 68.55.Ln, 68.55.Nq, 78.55.−m, 78.60.Hk, 78.66.Jg (all)
  14. A.A. Lebedev “Fragments from recollections of S. I. Vavilov18 958–959 (1975)
    07.78.+s, 07.60.Pb, 01.60.+q (all)
  15. G.V. Spivak, G.V. Saparin, M.K. Antoshin “Color contrast in scanning electron microscopy17 593–595 (1975)
    68.37.Hk, 78.60.Hk, 07.68.+m (all)
  16. A.E. Luk’yanov, G.V. Spivak, R.S. Gvozdover “Mirror electron microscopy16 529–552 (1974)
    07.78.+s, 68.37.−d (all)
  17. B.Yu. Mirgorodskii, D.Ya. Kostyukevich, D.A. Makarchenko “Demonstration microscope with field emission16 553–556 (1974)
    07.78.+s, 79.70.+q (all)
  18. B.K. Vainshtein “Three-dimensional electron microscopy of biological macromolecules16 185–206 (1973)
    87.64.Ee, 36.20.Ey, 87.14.Ee, 87.15.By (all)
  19. G.V. Spivak, G.V. Saparin, M.V. Bykov “Scanning electron microscopy12 756–776 (1970)
    07.78.+s, 68.37.Hk, 78.60.Hk, 61.72.Ff, 87.64.Ee (all)
  20. N.D. Zhevandrov “Vadim Leonidovich Levshin (obituary)13 421–423 (1970)
    01.60.+q, 78.55.−m, 78.60.Hk (all)
  21. R.F. Vasil’ev “Chemiluminescence in solutions9 504–524 (1967)
    78.60.Ps, 82.20.Pm, 82.30.−b, 78.60.Hk (all)
  22. V.I. Milyutin “Electron interference and phase microscopy4 576–583 (1962)
    07.78.+s
  23. L.G. Orlov, M.P. Usikov, L.M. Utevskii “Electron-microscope observation of dislocations in metals5 53–78 (1962)
    61.72.Ff, 61.72.Ji, 61.72.Nn (all)
  24. E.Yu. Kokorish, N.N. Sheftal’ “Dislocations in semiconductor crystals3 840–849 (1961)
    61.72.Bb, 61.72.Ff, 62.20.Fe, 71.20.Mq, 72.20.Jv, 61.72.Ss (all)
  25. D.M. Vasil’ev, B.I. Smirnov “Certain X-RAY diffraction methods of investigating cold worked metals4 226–259 (1961)
    61.10.Nz, 62.20.Fe, 61.72.Nn, 61.66.Bi, 61.72.Ff (all)
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