PACS numbers

07.78.+s Electron, positron, and ion microscopes; electron diffractometers 68.37.−d Microscopy of surfaces, interfaces, and thin films
  1. S.A. Aseyev, E.A. Ryabov “Investigation of structural dynamics of substances using ultrafast electron diffraction and microscopy62 289–293 (2019)
    07.78.+s, 61.05.J−, 64.70.D−, 64.70.K−, 68.37.Og (all)
  2. A.A. Ishchenko, S.A. Aseev et alUltrafast electron diffraction and electron microscopy: present status and future prospects57 633–669 (2014)
    07.78.+s, 61.05.J−, 64.70.D−, 64.70.K−, 68.37.Og (all)
  3. A.D. Pogrebnjak, A.G. Ponomarev et alApplication of micro- and nanoprobes to the analysis of small-sized 3D materials, nanosystems, and nanoobjects55 270–300 (2012)
    07.78.+s, 78.70.Bj, 81.16.Ta, 81.40.−z (all)
  4. M.V. Kuznetsov, A.S. Razinkin, A.L. Ivanovskii “Oxide nanostructures on a Nb surface and related systems: experiments and ab initio calculations53 995–1014 (2010)
    68.03.Hj, 68.35.B−, 68.35.Fx, 68.37.−d, 73.20.−r, 79.60.−i (all)
  5. V.I. Krauz, Yu.V. Martynenko et alNanostructures in controlled thermonuclear fusion devices53 1015–1038 (2010)
    52.27.Lw, 52.55.Fa, 68.37.−d (all)
  6. V.S. Edel’man “Scanning tunnel microscopy and spectroscopy of an atomically clean bismuth surface48 1057–1061 (2005)
    65.35.-p, 68.37.−d, 68.37.Ef (all)
  7. B.K. Vainshtein “Electron microscopy at atomic resolution30 393–419 (1987)
    07.78.+s, 68.37.Lp, 61.66.−f (all)
  8. A.A. Lebedev “Fragments from recollections of S. I. Vavilov18 958–959 (1975)
    07.78.+s, 07.60.Pb, 01.60.+q (all)
  9. A.E. Luk’yanov, G.V. Spivak, R.S. Gvozdover “Mirror electron microscopy16 529–552 (1974)
    07.78.+s, 68.37.−d (all)
  10. B.Yu. Mirgorodskii, D.Ya. Kostyukevich, D.A. Makarchenko “Demonstration microscope with field emission16 553–556 (1974)
    07.78.+s, 79.70.+q (all)
  11. V.I. Petrov, G.V. Spivak, O.P. Pavlyuchenko “Electron microscopy of magnetic structures of bulky objects13 766–777 (1971)
    75.25.+z, 75.60.Ch, 68.37.−d (all)
  12. G.V. Spivak, G.V. Saparin, M.V. Bykov “Scanning electron microscopy12 756–776 (1970)
    07.78.+s, 68.37.Hk, 78.60.Hk, 61.72.Ff, 87.64.Ee (all)
  13. V.I. Milyutin “Electron interference and phase microscopy4 576–583 (1962)
    07.78.+s
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