PACS numbers

07.78.+s Electron, positron, and ion microscopes; electron diffractometers 79.70.+q Field emission, ionization, evaporation, and desorption
  1. S.A. Aseyev, E.A. Ryabov “Investigation of structural dynamics of substances using ultrafast electron diffraction and microscopy62 289–293 (2019)
    07.78.+s, 61.05.J−, 64.70.D−, 64.70.K−, 68.37.Og (all)
  2. A.A. Ishchenko, S.A. Aseev et alUltrafast electron diffraction and electron microscopy: present status and future prospects57 633–669 (2014)
    07.78.+s, 61.05.J−, 64.70.D−, 64.70.K−, 68.37.Og (all)
  3. A.S. Bugaev, P.A. Eroshkin et alLow-power X-ray tubes: the current status56 691–703 (2013)
    07.85.Fv, 41.50.+h, 79.70.+q (all)
  4. A.D. Pogrebnjak, A.G. Ponomarev et alApplication of micro- and nanoprobes to the analysis of small-sized 3D materials, nanosystems, and nanoobjects55 270–300 (2012)
    07.78.+s, 78.70.Bj, 81.16.Ta, 81.40.−z (all)
  5. N.M. Blashenkov, G.Ya. Lavrent’ev “Surface-ionization field mass-spectrometry studies of nonequilibrium surface ionization50 53–78 (2007)
    33.80.Eh, 36.20.−r, 68.43.−h, 79.70.+q (all)
  6. A.A. Shklyaev, M. Ichikawa “Fabrication of germanium and silicon nanostructures using a scanning tunneling microscope49 887–903 (2006)
    68.37.Ef, 79.70.+q, 81.16.Ta (all)
  7. A.T. Rakhimov “Autoemission cathodes (cold emitters) on nanocrystalline carbon and nanodiamond films: physics, technology, applications43 926–929 (2000)
    79.60.Jv, 79.70.+q, 85.45.−w, 85.60.Pg (all)
  8. B.K. Vainshtein “Electron microscopy at atomic resolution30 393–419 (1987)
    07.78.+s, 68.37.Lp, 61.66.−f (all)
  9. M.D. Gabovich “Liquid-metal ion emitters26 447–455 (1983)
    79.70.+q
  10. A.A. Lebedev “Fragments from recollections of S. I. Vavilov18 958–959 (1975)
    07.78.+s, 07.60.Pb, 01.60.+q (all)
  11. S.A. Azimov, Yu.K. Vishchakas et alÉmmanuil ll’ich Adirovich (obituary)18 810–811 (1975)
    01.60.+q, 79.40.+z, 79.70.+q (all)
  12. S.P. Bugaev, E.A. Litvinov et alExplosive emission of electrons18 51–61 (1975)
    79.40.+z, 79.70.+q, 82.45.Fk (all)
  13. A.E. Luk’yanov, G.V. Spivak, R.S. Gvozdover “Mirror electron microscopy16 529–552 (1974)
    07.78.+s, 68.37.−d (all)
  14. B.Yu. Mirgorodskii, D.Ya. Kostyukevich, D.A. Makarchenko “Demonstration microscope with field emission16 553–556 (1974)
    07.78.+s, 79.70.+q (all)
  15. A.L. Suvorov, V.V. Trebukhovskii “Mass analysis and field-ion microscopy15 471–485 (1973)
    79.70.+q, 68.37.Vj, 32.80.Dz (all)
  16. V.A. Tsukerman, L.V. Tarasova, S.I. Lobov “New sources of X Rays14 61–71 (1971)
    07.85.Fv, 79.70.+q (all)
  17. G.V. Spivak, G.V. Saparin, M.V. Bykov “Scanning electron microscopy12 756–776 (1970)
    07.78.+s, 68.37.Hk, 78.60.Hk, 61.72.Ff, 87.64.Ee (all)
  18. V.I. Milyutin “Electron interference and phase microscopy4 576–583 (1962)
    07.78.+s
  19. E.M. Nadgornyĭ “The properties of whiskers5 462–477 (1962)
    68.70.+w, 81.40.Jj, 81.40.Lm, 61.72.Hh, 75.60.Ch, 79.70.+q (all)
  20. E.Ya. Zandberg, N.I. Ionov “Surface ionization2 255–281 (1959)
    73.30.+y, 79.70.+q, 68.47.De, 68.47.Fg, 68.35.Md, 73.20.At (all)
  21. E.D. Eidel’man, A.V. Arkhipov “Field emission from carbon nanostructures: models and experiment”, accepted
    79.70.+q, 73.63.−b, 71.38.Ht (all)
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