PACS numbers

61.05.C− X-ray diffraction and scattering 61.72.Dd Experimental determination of defects by diffraction and scattering 61.72.Ff Direct observation of dislocations and other defects (etch pits, decoration, electron microscopy, x-ray topography, etc.)
  1. G.V. Fetisov “X-ray diffraction methods for structural diagnostics of materials: progress and achievements63 2–32 (2020)
    07.85.−m, 42.55.Vc, 61.05.C− (all)
  2. T.S. Argunova, V.G. Kohn “Study of micropores in single crystals by in-line phase contrast imaging with synchrotron radiation62 602–616 (2019)
    42.25.Fx, 42.25.Kb, 61.72.−y, 61.72.Ff, 61.72.Lk (all)
  3. V.I. Karas’, V.I. Sokolenko “Nonequilibrium kinetics of the electron—phonon subsystem can give rise to electric- and magnetic-plasticity effects in crystals in alternating electric and/or magnetic fields61 1051–1071 (2018)
    61.72.Ff, 61.72.Hh, 62.20.Hg, 63.20.kd,, 75.80.+q, 83.60.Np (all)
  4. E.V. Suvorov, I.A. Smirnova “X-ray diffraction imaging of defects in topography (microscopy) studies58 833–849 (2015)
    61.05.C−, 61.72.Dd, 61.72.Ff (all)
  5. V.I. Punegov “High-resolution X-ray diffraction in crystalline structures with quantum dots58 419–445 (2015)
    61.05.C−, 68.65.−k (all)
  6. Celebrating the 65th anniversary of the Russian Federal Nuclear Center — All-Russian Research Institute of Experimental Physics (Scientific session of the Physical Sciences Division of the Russian Academy of Sciences, 6 October 2010)54 387–427 (2011)
    01.10.Fv, 01.65.+g, 05.70.Ce, 07.35.+k, 07.55.Db, 28.52.−s, 28.70.+y, 42.55.−f, 42.62.−b, 47.20.−k, 47.27.wj, 47.40.−x, 52.57.−z, 61.05.C−, 64.30.−t, 74.25.−q, 84.30.Ng, 84.70.+p, 85.70.−w (all)
  7. A.M. Podurets “Pulsed X-ray diffraction structure study of shocked materials54 408–414 (2011)
    07.35.+k, 47.40.−x, 61.05.C− (all)
  8. A.A. Katsnel’son, A.I. Olemskoi et alSelf-oscillation processes during the structure relaxation of palladium-metal alloys (Pd—W) saturated with hydrogen38 317–323 (1995)
    61.10.mY, 61.72.dD, 82.40.bJ
  9. A.A. Chernov “Elementary processes of crystal growth from solutions30 1098–1100 (1987)
    81.10.Dn, 61.72.Ff, 77.84.Fa, 68.35.Fx (all)
  10. G.V. Spivak, G.V. Saparin, M.V. Bykov “Scanning electron microscopy12 756–776 (1970)
    07.78.+s, 68.37.Hk, 78.60.Hk, 61.72.Ff, 87.64.Ee (all)
  11. L.G. Orlov, M.P. Usikov, L.M. Utevskii “Electron-microscope observation of dislocations in metals5 53–78 (1962)
    61.72.Ff, 61.72.Ji, 61.72.Nn (all)
  12. E.Yu. Kokorish, N.N. Sheftal’ “Dislocations in semiconductor crystals3 840–849 (1961)
    61.72.Bb, 61.72.Ff, 62.20.Fe, 71.20.Mq, 72.20.Jv, 61.72.Ss (all)
  13. D.M. Vasil’ev, B.I. Smirnov “Certain X-RAY diffraction methods of investigating cold worked metals4 226–259 (1961)
    61.10.Nz, 62.20.Fe, 61.72.Nn, 61.66.Bi, 61.72.Ff (all)
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