Instruments and methods of investigation

X-ray microscopy

Federal Scientific Research Center "Crystallography and Photonics", Russian Academy of Sciences, Shubnikov Institute of Crystallography, Russian Academy of Sciences, Leninskii prosp. 59, Moscow, 119333, Russian Federaion

X-ray microscopy is a technique for obtaining real-space two- or three-dimensional images of an object using elements of the focusing optics. In this paper, various types of microscopes are reviewed and their applicability is examined; methods for obtaining image contrast are discussed, and directions for the further development of X-ray microscopy are outlined.

Fulltext is available at IOP
Keywords: X-ray microscopy, X-ray optics, image contrast, X-ray spectroscopy
PACS: 07.85.Tt, 41.50.+h (all)
DOI: 10.3367/UFNe.2016.06.037830
Citation: Lider V V "X-ray microscopy" Phys. Usp. 60 187–203 (2017)
BibTexBibNote ® (generic)BibNote ® (RIS)MedlineRefWorks

Received: 25th, April 2016, revised: 30th, May 2016, 9th, June 2016

:    « » 187 201–219 (2017); DOI: 10.3367/UFNr.2016.06.037830

© 1918–2022 Uspekhi Fizicheskikh Nauk
Email: Editorial office contacts About the journal Terms and conditions