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Instruments and methods of investigation


X-ray microscopy


Shubnikov Institute of Crystallography, Russian Academy of Sciences, Leninskii prosp. 59, Moscow, 119333, Russian Federaion

X-ray microscopy is a technique for obtaining real-space two- or three-dimensional images of an object using elements of the focusing optics. In this paper, various types of microscopes are reviewed and their applicability is examined; methods for obtaining image contrast are discussed, and directions for the further development of X-ray microscopy are outlined.

Text can be downloaded in Russian. English translation is available here.
Keywords: X-ray microscopy, X-ray optics, image contrast, X-ray spectroscopy
PACS: 07.85.Tt, 41.50.+h (all)
DOI: 10.3367/UFNe.2016.06.037830
URL: https://ufn.ru/en/articles/2017/2/e/
Citation: Lider V V "X-ray microscopy" Phys. Usp. 60 187–203 (2017)
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Received: 25th, April 2016, revised: 30th, May 2016, 9th, June 2016

:    « » 187 201–219 (2017); DOI: 10.3367/UFNr.2016.06.037830

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