Talbot and Talbot—Lau X-ray interferometers

V.V. Lider^†
Federal Scientific Research Center "Crystallography and Photonics", Russian Academy of Sciences, Shubnikov Institute of Crystallography, Russian Academy of Sciences, Leninskii prosp. 59, Moscow, 119333, Russian Federaion

The operating principles and capabilities of X-ray grating interferometry are described using Talbot and Talbot—Lau interferometers as examples. Various types of diffraction gratings and methods for their production are described. Methods for collecting data in radiography and computed tomography, the origin of artifacts in X-ray images, and methods of suppressing them are considered. Particular attention is devoted to dark-field X-ray imaging and its application in medicine.

Keywords: X-ray radiation, refraction, interference, diffraction grating, X-ray moiré, phase contrast, dark-field contrast
PACS: 07.85.−m, 41.50.+h, 42.79.Dj, 87.59.−e (all)
DOI: 10.3367/UFNe.2022.12.039283
URL: https://ufn.ru/en/articles/2023/10/b/
Web of Science

001112744100002
Scopus

2-s2.0-85182916315
ADS NASA

2023PhyU...66..987L
Citation: Lider V V "Talbot and Talbot—Lau X-ray interferometers" Phys. Usp. 66 987–1007 (2023)

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Received: 19th, July 2022, revised: 9th, November 2022, accepted: 11th, December 2022

Оригинал: Лидер В В «Рентгеновские интерферометры Тальбота и Тальбота—Лау» УФН 193 1047–1070 (2023); DOI: 10.3367/UFNr.2022.12.039283

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