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Talbot and Talbot—Lau X-ray interferometersFederal Scientific Research Center "Crystallography and Photonics", Russian Academy of Sciences, Shubnikov Institute of Crystallography, Russian Academy of Sciences, Leninskii prosp. 59, Moscow, 119333, Russian Federaion The operating principles and capabilities of X-ray grating interferometry are described using Talbot and Talbot—Lau interferometers as examples. Various types of diffraction gratings and methods for their production are described. Methods for collecting data in radiography and computed tomography, the origin of artifacts in X-ray images, and methods of suppressing them are considered. Particular attention is devoted to dark-field X-ray imaging and its application in medicine.
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