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Issue 5, 2024
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Accepted articles
Instruments and methods of investigation


Scattering type apertureless scaning near-field optical microscopy

 a,  b
a Lebedev Physical Institute, Russian Academy of Sciences, Leninsky prosp. 53, Moscow, 119991, Russian Federation
b Moscow Technological University, prosp. Vernadskogo 78, Moscow, 119454, Russian Federation

Review paper considers the last advances achieved with Apertureless Scanning Near-field Microscopy (ASNOM), operating in light scattering mode (sSNOM) without any wavelength change. This review considers principles of operation of an ASNOM, technical solutions, artifacts known for ASNOM instruments. Theoretical models being used in ASNOM technique are considered. More success is mentioned in light influence on a sample under a tip (e.g. thermal expansion), mode articles were published concerning THz and microwave bands. Material contrast in surface imaging is considered, as well as surface spectroscopy of nanoscale areas. Images of standing and running plasmo- and phonon-polaritone waves were published, in particular over van-der-Waals materials and ghaphene. Hybrydisation of polaritone states was observed, due to interaction of the carriers in thin 2D object to the substrate. Lateral resolution of ASNOM (10-10nm)did not changed last 5-8 years significantly.

Keywords: микроскопия ближнего оптического поля, наноструктуры, спектроскопия, ASNOM, sSNOM
PACS: 07.79.Fc, 68.37.Ps, 07.60.−j, 87.64.Je, 61.46.+w, 85.30.De, 68.65.Pq (all)
DOI: 10.3367/UFNe.2024.02.039652
Citation: Kazantsev D V, Kazantseva E A "Scattering type apertureless scaning near-field optical microscopy" Phys. Usp., accepted

Received: 26th, May 2023, revised: 4th, October 2023, 27th, February 2024

Оригинал: Казанцев Д В, Казанцева Е А «Безапертурная ближнепольная микроскопия упругого рассеяния света» УФН, принята к публикации; DOI: 10.3367/UFNr.2024.02.039652

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