PACS numbers

85.30.De Semiconductor-device characterization, design, and modeling
  1. D.V. Kazantsev, E.V. Kuznetsov et alApertureless near-field optical microscopy60 259–275 (2017)
    07.60.−j, 07.79.Fc, 61.46.−w, 68.37.Ps, 68.65.Pq, 85.30.De, 87.64.−t (all)
  2. V.I. Fistul’, N.Z. Shvarts “TUNNEL DIODES5 430–459 (1962)
    85.30.Mn, 73.40.Gk, 73.40.Kp, 85.30.De (all)
  3. D.V. Kazantsev, E.A. Kazantseva “Scattering type apertureless scaning near-field optical microscopy”, accepted
    07.79.Fc, 68.37.Ps, 07.60.−j, 87.64.Je, 61.46.+w, 85.30.De, 68.65.Pq (all)
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