Reviews of topical problems

Multilayer X-ray interference structures

Federal Scientific Research Center "Crystallography and Photonics", Russian Academy of Sciences, Shubnikov Institute of Crystallography, Russian Academy of Sciences, Leninskii prosp. 59, Moscow, 119333, Russian Federaion

Functional principles, state of the art, and issues of multilayer X-ray optics are reviewed. Methods to optimize planar multilayer interference structures and multilayer diffraction gratings and their application in academic research and technology are discussed.

Fulltext is available at IOP
Keywords: multilayer systems, diffraction gratings, X-rays, X-ray optics, diffraction, interference, spectral resolution
PACS: 07.85.−m, 41.50.+h, 42.79.Dj, 42.88.+h, 61.05.cp, 78.20.Bh, 78.67.Pt, 95.55.Ka (all)
DOI: 10.3367/UFNe.2018.10.038439
Citation: Lider V V "Multilayer X-ray interference structures" Phys. Usp. 62 1063–1095 (2019)
BibTex BibNote ® (generic)BibNote ® (RIS)MedlineRefWorks
%0 Journal Article
%T Multilayer X-ray interference structures
%A V. V. Lider
%I Physics-Uspekhi
%D 2019
%J Phys. Usp.
%V 62
%N 11
%P 1063-1095

Received: 12th, July 2018, revised: 24th, September 2018, 4th, October 2018

Оригинал: Лидер В В «Многослойные рентгеновские интерференционные структуры» УФН 189 1137–1171 (2019); DOI: 10.3367/UFNr.2018.10.038439

© 1918–2022 Uspekhi Fizicheskikh Nauk
Email: Editorial office contacts About the journal Terms and conditions