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Multilayer X-ray interference structures


Federal Scientific Research Center "Crystallography and Photonics", Russian Academy of Sciences, Shubnikov Institute of Crystallography, Russian Academy of Sciences, Leninskii prosp. 59, Moscow, 119333, Russian Federaion

Functional principles, state of the art, and issues of multilayer X-ray optics are reviewed. Methods to optimize planar multilayer interference structures and multilayer diffraction gratings and their application in academic research and technology are discussed.

Fulltext is available at IOP
Keywords: multilayer systems, diffraction gratings, X-rays, X-ray optics, diffraction, interference, spectral resolution
PACS: 07.85.−m, 41.50.+h, 42.79.Dj, 42.88.+h, 61.05.cp, 78.20.Bh, 78.67.Pt, 95.55.Ka (all)
DOI: 10.3367/UFNe.2018.10.038439
URL: https://ufn.ru/en/articles/2019/11/a/
Citation: Lider V V "Multilayer X-ray interference structures" Phys. Usp. 62 1063–1095 (2019)
BibTexBibNote ® (generic)BibNote ® (RIS)Medline RefWorks
RT Journal
T1 Multilayer X-ray interference structures
A1 Lider,V.V.
PB Physics-Uspekhi
PY 2019
FD 10 Nov, 2019
JF Physics-Uspekhi
JO Phys. Usp.
VO 62
IS 11
SP 1063-1095
DO 10.3367/UFNe.2018.10.038439
LK https://ufn.ru/en/articles/2019/11/a/

Received: 12th, July 2018, revised: 24th, September 2018, 4th, October 2018

Оригинал: Лидер В В «Многослойные рентгеновские интерференционные структуры» УФН 189 1137–1171 (2019); DOI: 10.3367/UFNr.2018.10.038439

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