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Talbot and Talbot—Lau X-ray interferometers

 
Federal Scientific Research Center "Crystallography and Photonics", Russian Academy of Sciences, Shubnikov Institute of Crystallography, Russian Academy of Sciences, Leninskii prosp. 59, Moscow, 119333, Russian Federaion

The operating principles and capabilities of X-ray grating interferometry are described using Talbot and Talbot—Lau interferometers as examples. Various types of diffraction gratings and methods for their production are described. Methods for collecting data in radiography and computed tomography, the origin of artifacts in X-ray images, and methods of suppressing them are considered. Particular attention is devoted to dark-field X-ray imaging and its application in medicine.

Fulltext pdf (5 MB)
Fulltext is also available at DOI: 10.3367/UFNe.2022.12.039283
Keywords: X-ray radiation, refraction, interference, diffraction grating, X-ray moiré, phase contrast, dark-field contrast
PACS: 07.85.−m, 41.50.+h, 42.79.Dj, 87.59.−e (all)
DOI: 10.3367/UFNe.2022.12.039283
URL: https://ufn.ru/en/articles/2023/10/b/
001112744100002
2-s2.0-85182916315
2023PhyU...66..987L
Citation: Lider V V "Talbot and Talbot—Lau X-ray interferometers" Phys. Usp. 66 987–1007 (2023)
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Received: 19th, July 2022, revised: 9th, November 2022, 11th, December 2022

Оригинал: Лидер В В «Рентгеновские интерферометры Тальбота и Тальбота—Лау» УФН 193 1047–1070 (2023); DOI: 10.3367/UFNr.2022.12.039283

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