X-ray diffraction imaging of defects in topography (microscopy) studies

E.V. Suvorov, I.A. Smirnova
Osipyan Institute of Solid State Physics, Russian Academy of Sciences, Akademika Osip'yana str. 2, Chernogolovka, Moscow Region, 142432, Russian Federation

This review examines how the X-ray diffraction images of crystal lattice defects form and acquire structure when using X-ray topography methods. The description approaches (beam optics and wave optics) and application fields of the geometrical and diffraction optics of a real crystal are analyzed. Specific experimental images of dislocations and other defects are used as examples to demonstrate the role of various diffraction effects (wave reflection from lattice distortions, diffraction focusing, channeling) in determining the nature of the image formed. The potential for obtaining quantitative information on defect parameters is discussed.

Keywords: crystal structure defects, X-ray diffraction physics, X-ray topography, X-ray optics, diffraction contrast of defects, diffraction image, section topograms, Bloch waves, beam paths, elastic dislocation field, Takagi—Topen equations, diffraction image simulation
PACS: 61.05.C−, 61.72.Dd, 61.72.Ff (all)
DOI: 10.3367/UFNe.0185.201509a.0897
URL: https://ufn.ru/en/articles/2015/9/a/
Web of Science

000366405400001
ADS NASA

2015PhyU...58..833S
Citation: Suvorov E V, Smirnova I A "X-ray diffraction imaging of defects in topography (microscopy) studies" Phys. Usp. 58 833–849 (2015)

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Received: 5th, May 2015, accepted: 9th, June 2015

Оригинал: Суворов Э В, Смирнова И А «Дифракционное изображение дефектов в рентгеновской топографии (рентгеновской микроскопии)» УФН 185 897–915 (2015); DOI: 10.3367/UFNr.0185.201509a.0897

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