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Optical properties of strained Si1-xGex and Si1-x-yGexCy heterostructures
Institute of Microstructure Physics, Russian Academy of Sciences, ul. Ulyanova 46, Nizhnii Novgorod, 603600, Russian Federation
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PACS: 79.60.Jv, 85.30.Vw, 85.60.−q ()
DOI: URL: https://ufn.ru/en/articles/2000/3/i/  000087162100014 Citation: Krasil’nik Z F, Novikov A V "Optical properties of strained Si1-xGex and Si1-x-yGexCy heterostructures" Phys. Usp. 43 295–298 (2000) Оригинал: Красильник З Ф, Новиков А В «Оптические свойства напряженных гетероструктур на основе Si1-xGex и Si1-x-yGexCy» УФН 170 338–341 (2000); |
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