Optical properties of strained Si1–xGex and Si1–x–yGexCy heterostructures

Z.F. Krasil’nik, A.V. Novikov
Institute of Microstructure Physics, Russian Academy of Sciences, ul. Ulyanova 46, Nizhnii Novgorod, 603600, Russian Federation

PACS: 79.60.Jv, 85.30.Vw, 85.60.−q (all)
DOI: 10.1070/PU2000v043n03ABEH000703
URL: https://ufn.ru/en/articles/2000/3/i/
Web of Science

000087162100014
Citation: Krasil’nik Z F, Novikov A V "Optical properties of strained Si_1-xGe_x and Si_1-x-yGe_xC_y heterostructures" Phys. Usp. 43 295–298 (2000)

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@article{Krasil’nik:2000,
	author = {Z. F. Krasil’nik and A. V. Novikov},
	title = {Optical properties of strained Si_1–xGe_x and Si_1–x–yGe_xC_y heterostructures},
	publisher = {Physics-Uspekhi},
	year = {2000},
	journal = {Phys. Usp.},
	volume = {43},
	number = {3},
	pages = {295-298},
	url = {https://ufn.ru/en/articles/2000/3/i/},
	doi = {10.1070/PU2000v043n03ABEH000703}
}

Оригинал: Красильник З Ф, Новиков А В «Оптические свойства напряженных гетероструктур на основе Si_1-xGe_x и Si_1-x-yGe_xC_y» УФН 170 338–341 (2000); DOI: 10.3367/UFNr.0170.200003n.0338

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Optical properties of strained Si1-xGex and Si1-x-yGexCy heterostructures

Optical properties of strained Si_1-xGe_x and Si_1-x-yGe_xC_y heterostructures