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Conferences and symposia


Optical properties of strained Si1-xGex and Si1-x-yGexCy heterostructures

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Institute of Microstructure Physics, Russian Academy of Sciences, ul. Ulyanova 46, Nizhnii Novgorod, 603600, Russian Federation
Fulltext pdf (226 KB)
Fulltext is also available at DOI: 10.1070/PU2000v043n03ABEH000703
PACS: 79.60.Jv, 85.30.Vw, 85.60.−q (all)
DOI: 10.1070/PU2000v043n03ABEH000703
URL: https://ufn.ru/en/articles/2000/3/i/
000087162100014
Citation: Krasil’nik Z F, Novikov A V "Optical properties of strained Si1-xGex and Si1-x-yGexCy heterostructures" Phys. Usp. 43 295–298 (2000)
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Оригинал: Красильник З Ф, Новиков А В «Оптические свойства напряженных гетероструктур на основе Si1-xGex и Si1-x-yGexCy» УФН 170 338–341 (2000); DOI: 10.3367/UFNr.0170.200003n.0338

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