Optical properties of strained Si1–xGex and Si1–x–yGexCy heterostructures

Z.F. Krasil’nik, A.V. Novikov
Institute of Microstructure Physics, Russian Academy of Sciences, ul. Ulyanova 46, Nizhnii Novgorod, 603600, Russian Federation

PACS: 79.60.Jv, 85.30.Vw, 85.60.−q (all)
DOI: 10.1070/PU2000v043n03ABEH000703
URL: https://ufn.ru/en/articles/2000/3/i/
Web of Science

000087162100014
Citation: Krasil’nik Z F, Novikov A V "Optical properties of strained Si_1-xGe_x and Si_1-x-yGe_xC_y heterostructures" Phys. Usp. 43 295–298 (2000)

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PT Journal Article
TI Optical properties of strained Si_1–xGe_x and Si_1–x–yGe_xC_y heterostructures
AU Krasil’nik Z F
FAU Krasil’nik ZF
AU Novikov A V
FAU Novikov AV
DP 10 Mar, 2000
TA Phys. Usp.
VI 43
IP 3
PG 295-298
RX 10.1070/PU2000v043n03ABEH000703
URL https://ufn.ru/en/articles/2000/3/i/
SO Phys. Usp. 2000 Mar 10;43(3):295-298

Оригинал: Красильник З Ф, Новиков А В «Оптические свойства напряженных гетероструктур на основе Si_1-xGe_x и Si_1-x-yGe_xC_y» УФН 170 338–341 (2000); DOI: 10.3367/UFNr.0170.200003n.0338

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Optical properties of strained Si1-xGex and Si1-x-yGexCy heterostructures

Optical properties of strained Si_1-xGe_x and Si_1-x-yGe_xC_y heterostructures