Issues

 / 

1997

 / 

November

  

Instruments and methods of investigation


Atomic structures on a GaAs(001) surface grown by molecular beam epitaxy

 a,  b,  c,  c
a Department of Physical Electronics, Bashkir State University, Ufa, Russian Federation
b Hitachi Advanced Research Laboratory, Hitachi Ltd., Hatoyama, Saitama, Japan
c Institute for Materials Research, Tohoku University, 2-1-1 Katahira, Sendai, 980-77, Japan

A unique apparatus for in-situ atomic-resolution study of solid state structures grown by molecular beam epitaxy (MBE) is developed, in which a scanning tunneling microscope (STM) is combined with an MBE chamber within the same vacuum system. The utility of the apparatus is demonstrated by examining atomic structures on a molecular-beam-epitaxial GaAs(001) surface over a wide range of [As]/[Ga] ratios. By varying the As surface coverage, the 2×4 — α, β, γ and c(4×4) phases are examined in detail. High-resolution STM images indicate that 2×4 — α, β, and γ phases in the outermost surface layer have essentially the same unit cell consisting of two As dimers and two As dimer vacancies. Using the STM images, reflection high-energy electron diffraction (RHEED) patterns and dynamical RHEED calculations, the existing structural models for the 2×4 phases are analysed and a new model of the As-rich GaAs(001) surface is proposed, found to be consistent with most of the previous observations.

Fulltext pdf (456 KB)
Fulltext is also available at DOI: 10.1070/PU1997v040n11ABEH000309
PACS: 61.14.Hg, 61.16.Di, 68.55.Bd
DOI: 10.1070/PU1997v040n11ABEH000309
URL: https://ufn.ru/en/articles/1997/11/f/
000071302300006
Citation: Bakhtizin R Z, Hashizume T, Xue Q-K, Sakurai T "Atomic structures on a GaAs(001) surface grown by molecular beam epitaxy" Phys. Usp. 40 1175–1187 (1997)
BibTexBibNote ® (generic)BibNote ® (RIS)MedlineRefWorks

Оригинал: Бахтизин Р З, Хашицуме Т, Щуе Ч-К, Сакурай Т «Атомные структуры на поверхности GaAs(001), выращенной методами молекулярно-лучевой эпитаксии» УФН 167 1227–1241 (1997); DOI: 10.3367/UFNr.0167.199711f.1227

References (60) Cited by (4) Similar articles (7) ↓

  1. R.Z. Bakhtizin, T. Hashizume et alScanning tunneling microscopy of fullerenes on metal and semiconductor surfaces40 275–290 (1997)
  2. A.A. Babad-Zakhryapin, N.S. Gorbunov, V.I. Izvekov “Experimental techniques of low-energy electron diffraction5 711–722 (1963)
  3. N.N. Kudryavtsev, O.A. Mazyar, A.M. Sukhov “Apparatus and techniques for the investigation of methods of generating molecular beams36 (6) 513–528 (1993)
  4. L.V. Arapkina, V.A. Yuryev “Classification of Ge hut clusters in arrays formed by molecular beam epitaxy at low temperatures on the Si(001) surface53 279–290 (2010)
  5. V.Yu. Khomich, V.A. Shmakov “Large-sized mirrors for power optics62 249–256 (2019)
  6. S.A. Pshenichnyuk, N.L. Asfandiarov et alState of the art in dissociative electron attachment spectroscopy and its prospects65 163–188 (2022)
  7. A.A. Dedkova, I.V. Florinsky, N.A. Djuzhev “Approaches to determining curvature of wafers by their topography65 706–722 (2022)

The list is formed automatically.

© 1918–2024 Uspekhi Fizicheskikh Nauk
Email: ufn@ufn.ru Editorial office contacts About the journal Terms and conditions