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Scanning tunneling microscopy: new method for studying solid surfaces

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Fulltext is also available at DOI: 10.1070/PU1984v027n01ABEH004022
PACS: 07.79.Cz, 68.37.Ef (all)
DOI: 10.1070/PU1984v027n01ABEH004022
URL: https://ufn.ru/en/articles/1984/1/f/
Citation: Revokatova I P, Silin A P "Scanning tunneling microscopy: new method for studying solid surfaces" Sov. Phys. Usp. 27 76–78 (1984)
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Оригинал: Ревокатова И П, Силин А П «Вакуумная туннельная микроскопия — новый метод изучения поверхности твердых тел» УФН 142 159–162 (1984); DOI: 10.3367/UFNr.0142.198401g.0159

Cited by (4) Similar articles (3) ↓

  1. V.M. Svistunov, M.A. Belogolovskii, A.I. D’yachenko “Vacuum tunneling microscopy and spectroscopy31 86–89 (1988)
  2. N.S. Maslova, V.I. Panov “Scanning tunneling microscopy of atomic structure, electronic properties, and surface chemical reactions32 93–99 (1989)
  3. A.I. Vorob’eva “Fabrication techniques of electrode arrays for carbon nanotubes52 225–234 (2009)

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