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Scanning tunneling microscopy: new method for studying solid surfaces

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Fulltext is also available at DOI: 10.1070/PU1984v027n01ABEH004022
PACS: 07.79.Cz, 68.37.Ef (all)
DOI: 10.1070/PU1984v027n01ABEH004022
URL: https://ufn.ru/en/articles/1984/1/f/
Citation: Revokatova I P, Silin A P "Scanning tunneling microscopy: new method for studying solid surfaces" Sov. Phys. Usp. 27 76–78 (1984)
BibTexBibNote ® (generic)BibNote ® (RIS)MedlineRefWorks
@article{Revokatova:1984,
	author = {I. P. Revokatova and A. P. Silin},
	title = {Scanning tunneling microscopy: new method for studying solid surfaces},
	publisher = {Physics-Uspekhi},
	year = {1984},
	journal = {Phys. Usp.},
	volume = {27},
	number = {1},
	pages = {76-78},
	url = {https://ufn.ru/en/articles/1984/1/f/},
	doi = {10.1070/PU1984v027n01ABEH004022}
}

Оригинал: Ревокатова И П, Силин А П «Вакуумная туннельная микроскопия — новый метод изучения поверхности твердых тел» УФН 142 159–162 (1984); DOI: 10.3367/UFNr.0142.198401g.0159

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