CONTENTS
1. Introduction. Concept of Exoelectronic Emission. Structure Sensitivity of the Effect 697
2. Instruments and Method of Registering the Parameters of Exoelectronic Emission 699
3. Physical Nature of Exoelectronic Emission 700
4. Exoelectronic Emission of Elemental Semiconductors 701
5. Exoelectronic Emission of Semiconductor Compounds 704
6. Conclusion 705
References 706

@article{Mints:1976,
	author = {R. I. Mints and I. I. Mil’man and V. I. Kryuk},
	title = {Exoelectronic emission of semiconductors},
	publisher = {Physics-Uspekhi},
	year = {1976},
	journal = {Phys. Usp.},
	volume = {19},
	number = {8},
	pages = {697-707},
	url = {https://ufn.ru/en/articles/1976/8/d/},
	doi = {10.1070/PU1976v019n08ABEH005287}
}