Issues

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1976

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August

  

From the current literature


Exoelectronic emission of semiconductors

CONTENTS
1. Introduction. Concept of Exoelectronic Emission. Structure Sensitivity of the Effect 697
2. Instruments and Method of Registering the Parameters of Exoelectronic Emission 699
3. Physical Nature of Exoelectronic Emission 700
4. Exoelectronic Emission of Elemental Semiconductors 701
5. Exoelectronic Emission of Semiconductor Compounds 704
6. Conclusion 705
References 706

Fulltext pdf (1.1 MB)
Fulltext is also available at DOI: 10.1070/PU1976v019n08ABEH005287
PACS: 79.75.+g
DOI: 10.1070/PU1976v019n08ABEH005287
URL: https://ufn.ru/en/articles/1976/8/d/
Citation: Mints R I, Mil’man I I, Kryuk V I "Exoelectronic emission of semiconductors" Sov. Phys. Usp. 19 697–707 (1976)
BibTexBibNote ® (generic) BibNote ® (RIS)MedlineRefWorks
TY JOUR
TI Exoelectronic emission of semiconductors
AU Mints, R. I.
AU Mil’man, I. I.
AU Kryuk, V. I.
PB Physics-Uspekhi
PY 1976
JO Physics-Uspekhi
JF Physics-Uspekhi
JA Phys. Usp.
VL 19
IS 8
SP 697-707
UR https://ufn.ru/en/articles/1976/8/d/
ER https://doi.org/10.1070/PU1976v019n08ABEH005287

Оригинал: Минц Р И, Мильман И И, Крюк В И «Экзоэлектронная эмиссия полупроводников» УФН 119 749–766 (1976); DOI: 10.3367/UFNr.0119.197608g.0749

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