PACS numbers

61.72.Yx Interaction between different crystal defects; gettering effect
  1. A.R. Chelyadinskii, F.F. Komarov “Defect-impurity engineering in implanted silicon46 789–820 (2003)
    61.72.Cc, 61.72.Tt, 61.72.Yx (all)
  2. V.V. Kirsanov, A.N. Orlov “Computer simulation of the atomic structure of defects in metals27 106–133 (1984)
    61.72.Ji, 61.72.Bb, 61.72.Yx, 66.30.Lw, 61.72.Lk, 61.72.Mm (all)
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