Toshio Sakurai



Institute for Materials Research, Tohoku University
Address: 2-1-1 Katahira, Sendai, 980-77, Japan


Articles

  1. R.Z. Bakhtizin, Q.-Zh. Xue, Q.-K. Xue et alScanning tunneling microscopy studies of III-nitride thin film heteroepitaxial growthPhys. Usp. 47 371–391 (2004)
  2. R.Z. Bakhtizin, T. Hashizume, Q.-K. Xue, T. Sakurai “Atomic structures on a GaAs(001) surface grown by molecular beam epitaxyPhys. Usp. 40 1175–1187 (1997)
  3. R.Z. Bakhtizin, T. Hashizume, Sh. Wang, T. Sakurai “Scanning tunneling microscopy of fullerenes on metal and semiconductor surfacesPhys. Usp. 40 275–290 (1997)

See also: R.Z. Bakhtizin, Q.-K. Xue, T. Hashizume, Q.-Zh. Xue, K.-H. Wu, Sh. Wang

PACS: 61.14.Hg, 71.15.Nc, 81.05.Ea, 61.16.Di, 68.55.Bd, 68.35.Bs, 61.16.Ch, 61.46.+w, 68.65.+g

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