Review paper considers the last advances achieved with Apertureless Scanning Near-field Microscopy (ASNOM), operating in light scattering mode (sSNOM) without any wavelength change. This review considers principles of operation of an ASNOM, technical solutions, artifacts known for ASNOM instruments. Theoretical models being used in ASNOM technique are considered. More success is mentioned in light influence on a sample under a tip (e.g. thermal expansion), mode articles were published concerning THz and microwave bands. Material contrast in surface imaging is considered, as well as surface spectroscopy of nanoscale areas. Images of standing and running plasmo- and phonon-polaritone waves were published, in particular over van-der-Waals materials and ghaphene. Hybrydisation of polaritone states was observed, due to interaction of the carriers in thin 2D object to the substrate. Lateral resolution of ASNOM (10-10nm)did not changed last 5-8 years significantly.