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Instruments and methods of investigation


X-ray microscopy


Federal Scientific Research Center "Crystallography and Photonics", Russian Academy of Sciences, Shubnikov Institute of Crystallography, Russian Academy of Sciences, Leninskii prosp. 59, Moscow, 119333, Russian Federaion

X-ray microscopy is a technique for obtaining real-space two- or three-dimensional images of an object using elements of the focusing optics. In this paper, various types of microscopes are reviewed and their applicability is examined; methods for obtaining image contrast are discussed, and directions for the further development of X-ray microscopy are outlined.

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Fulltext is also available at DOI: 10.3367/UFNe.2016.06.037830
Keywords: X-ray microscopy, X-ray optics, image contrast, X-ray spectroscopy
PACS: 07.85.Tt, 41.50.+h (all)
DOI: 10.3367/UFNe.2016.06.037830
URL: https://ufn.ru/en/articles/2017/2/e/
000401039000005
2-s2.0-85019124476
2017PhyU...60..187L
Citation: Lider V V "X-ray microscopy" Phys. Usp. 60 187–203 (2017)
BibTexBibNote ® (generic) BibNote ® (RIS)MedlineRefWorks
TY JOUR
TI X-ray microscopy
AU Lider, V. V.
PB Physics-Uspekhi
PY 2017
JO Physics-Uspekhi
JF Physics-Uspekhi
JA Phys. Usp.
VL 60
IS 2
SP 187-203
UR https://ufn.ru/en/articles/2017/2/e/
ER https://doi.org/10.3367/UFNe.2016.06.037830

Received: 25th, April 2016, revised: 30th, May 2016, 9th, June 2016

Оригинал: Лидер В В «Рентгеновская микроскопия» УФН 187 201–219 (2017); DOI: 10.3367/UFNr.2016.06.037830

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