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Instruments and methods of investigation


X-ray microscopy


Federal Scientific Research Center "Crystallography and Photonics", Russian Academy of Sciences, Shubnikov Institute of Crystallography, Russian Academy of Sciences, Leninskii prosp. 59, Moscow, 119333, Russian Federaion

X-ray microscopy is a technique for obtaining real-space two- or three-dimensional images of an object using elements of the focusing optics. In this paper, various types of microscopes are reviewed and their applicability is examined; methods for obtaining image contrast are discussed, and directions for the further development of X-ray microscopy are outlined.

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Fulltext is also available at DOI: 10.3367/UFNe.2016.06.037830
Keywords: X-ray microscopy, X-ray optics, image contrast, X-ray spectroscopy
PACS: 07.85.Tt, 41.50.+h (all)
DOI: 10.3367/UFNe.2016.06.037830
URL: https://ufn.ru/en/articles/2017/2/e/
000401039000005
2-s2.0-85019124476
2017PhyU...60..187L
Citation: Lider V V "X-ray microscopy" Phys. Usp. 60 187–203 (2017)
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Received: 25th, April 2016, revised: 30th, May 2016, 9th, June 2016

Оригинал: Лидер В В «Рентгеновская микроскопия» УФН 187 201–219 (2017); DOI: 10.3367/UFNr.2016.06.037830

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  1. Yang M, Chu X, Tsai Yu-L S J. Cosmol. Astropart. Phys. 2026 (10) 059 (2026)
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  3. Gwon S-Y, Choi M, Mun J Y Appl. Microsc. 55 (1) (2025)
  4. Wang S, Jiang Ch et al Adv Devices Instrum 6 (2025)
  5. Radini A, Parker Ju E Encyclopedia of Archaeology (Second Edition, 2024) p. 1080
  6. Wang Sh, Yang Z et al TrAC Trends In Analytical Chemistry 170 117453 (2024)
  7. Arnold W, Goebbels K, Kumar A Springer Series In Materials Science Vol. Non-destructive Materials Characterization and EvaluationNon-destructive Materials Characterization using Ionizing Radiation329 Chapter 2 (2023) p. 135
  8. Jigmeddorj V, Jamsranjav E et al XST 31 (5) 951 (2023)
  9. Fritzsche S, Jaenisch Gerd-Rüdiger et al Applied Sciences 12 (20) 10488 (2022)
  10. Lider V V J. Surf. Investig. 15 (1) 28 (2021)
  11. Mitrofanov A V, Popov A V, Prokopovich D V Tech. Phys. 65 (11) 1814 (2020)
  12. Smith T A, Wang Zh, Shih Ya Opt. Express 28 (22) 32249 (2020)
  13. Lider V V J. Surf. Investig. 13 (4) 670 (2019)
  14. Edwards Thomas D  P, Kavanagh B J et al Phys. Rev. D 99 (4) (2019)
  15. Wen H, Cherukara M J, Holt M V Annu. Rev. Mater. Res. 49 (1) 389 (2019)
  16. Lühl Lars, Andrianov K et al J Synchrotron Rad 26 (2) 430 (2019)
  17. "Development of electron tomography on liquid suspensions using environmental scanning electron microscopy" Lyon, (2017)
  18. Klimova N, Serebrennikov D et al Advances in Laboratory-based X-Ray Sources, Optics, and Applications VI, (2017) p. 11
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