Scanning tunnelling and atomic force microscopy of surfaces modified by ion and laser beams

A.A. Bukharaev
Zavoisky Physical-Technical Institute, FRC Kazan Scientific Center of RAS, Sibirskii trakt 10/7, Kazan, Республика Татарстан, 420029, Russian Federation

PACS: 07.79.Cz, 07.79.Lh, 42.62.Hk (all)
DOI: 10.1070/PU1996v039n02ABEH001499
URL: https://ufn.ru/en/articles/1996/2/h/
Web of Science

A1996UB80800009
Citation: Bukharaev A A "Scanning tunnelling and atomic force microscopy of surfaces modified by ion and laser beams" Phys. Usp. 39 193–196 (1996)

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Оригинал: Бухараев А А «Исследование с помощью сканирующей туннельной и атомно-силовой микроскопии поверхностей, модифицированных ионными и лазерными пучками» УФН 166 210–213 (1996); DOI: 10.3367/UFNr.0166.199602i.0210

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