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Scanning tunnelling and atomic force microscopy of surfaces modified by ion and laser beams


E.K. Zavoiskii Kazan Physicotechnical Institute, Kazan Scientific Centre of the Russian Academy of Sciences, Sibirskii trakt 10/7, Kazan, 420029, Russian Federation
Fulltext pdf (821 KB)
Fulltext is also available at DOI: 10.1070/PU1996v039n02ABEH001499
PACS: 07.79.Cz, 07.79.Lh, 42.62.Hk (all)
DOI: 10.1070/PU1996v039n02ABEH001499
URL: https://ufn.ru/en/articles/1996/2/h/
A1996UB80800009
Citation: Bukharaev A A "Scanning tunnelling and atomic force microscopy of surfaces modified by ion and laser beams" Phys. Usp. 39 193–196 (1996)
BibTex BibNote ® (generic)BibNote ® (RIS)MedlineRefWorks
%0 Journal Article
%T Scanning tunnelling and atomic force microscopy of surfaces modified by ion and laser beams

%A A. A. Bukharaev
%I Physics-Uspekhi
%D 1996
%J Phys. Usp.
%V 39
%N 2
%P 193-196
%U https://ufn.ru/en/articles/1996/2/h/
%U https://doi.org/10.1070/PU1996v039n02ABEH001499

Îðèãèíàë: Áóõàðàåâ À À «Èññëåäîâàíèå ñ ïîìîùüþ ñêàíèðóþùåé òóííåëüíîé è àòîìíî-ñèëîâîé ìèêðîñêîïèè ïîâåðõíîñòåé, ìîäèôèöèðîâàííûõ èîííûìè è ëàçåðíûìè ïó÷êàìè» ÓÔÍ 166 210–213 (1996); DOI: 10.3367/UFNr.0166.199602i.0210

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