Scanning tunnelling and atomic force microscopy of surfaces modified by ion and laser beams

A.A. Bukharaev
E.K. Zavoiskii Kazan Physicotechnical Institute, Kazan Scientific Centre of the Russian Academy of Sciences, Sibirskii trakt 10/7, Kazan, 420029, Russian Federation

PACS: 07.79.Cz, 07.79.Lh, 42.62.Hk (all)
DOI: 10.1070/PU1996v039n02ABEH001499
URL: https://ufn.ru/en/articles/1996/2/h/
Web of Science

A1996UB80800009
Citation: Bukharaev A A "Scanning tunnelling and atomic force microscopy of surfaces modified by ion and laser beams" Phys. Usp. 39 193–196 (1996)

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TY JOUR
TI Scanning tunnelling and atomic force microscopy of surfaces modified by ion and laser beams

AU Bukharaev, A. A.
PB Physics-Uspekhi
PY 1996
JO Physics-Uspekhi
JF Physics-Uspekhi
JA Phys. Usp.
VL 39
IS 2
SP 193-196
UR https://ufn.ru/en/articles/1996/2/h/
ER https://doi.org/10.1070/PU1996v039n02ABEH001499

Оригинал: Бухараев А А «Исследование с помощью сканирующей туннельной и атомно-силовой микроскопии поверхностей, модифицированных ионными и лазерными пучками» УФН 166 210–213 (1996); DOI: 10.3367/UFNr.0166.199602i.0210