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| Issue 7, 2024 |
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PACS numbers
85.30.De Semiconductor-device characterization, design, and modeling
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D.V. Kazantsev, E.A. Kazantseva “Scattering-type apertureless scanning near-field optical microscopy” 67 (6) (2024)
07.60.−j, 07.79.Fc, 61.46.−w, 68.37.Ps, 68.65.Pq, 85.30.De, 87.64.kp () -
D.V. Kazantsev, E.V. Kuznetsov et al “Apertureless near-field optical microscopy” 60 259–275 (2017)
07.60.−j, 07.79.Fc, 61.46.−w, 68.37.Ps, 68.65.Pq, 85.30.De, 87.64.−t () -
V.I. Fistul’, N.Z. Shvarts “TUNNEL DIODES” 5 430–459 (1962)
85.30.Mn, 73.40.Gk, 73.40.Kp, 85.30.De ()
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