61.72.Ff Direct observation of dislocations and other defects (etch pits, decoration, electron microscopy, x-ray topography, etc.)

T.S. Argunova, V.G. Kohn “Study of micropores in single crystals by in-line phase contrast imaging with synchrotron radiation” Phys. Usp. 62 602–616 (2019)
42.25.Fx, 42.25.Kb, 61.72.−y, 61.72.Ff, 61.72.Lk (all)
V.I. Karas’, V.I. Sokolenko “Nonequilibrium kinetics of the electron—phonon subsystem can give rise to electric- and magnetic-plasticity effects in crystals in alternating electric and/or magnetic fields” Phys. Usp. 61 1051–1071 (2018)
61.72.Ff, 61.72.Hh, 62.20.Hg, 63.20.kd, 63.20.kp, 75.80.+q, 83.60.Np (all)
E.V. Suvorov, I.A. Smirnova “X-ray diffraction imaging of defects in topography (microscopy) studies” Phys. Usp. 58 833–849 (2015)
61.05.C−, 61.72.Dd, 61.72.Ff (all)
A.A. Chernov “Elementary processes of crystal growth from solutions” Sov. Phys. Usp. 30 1098–1100 (1987)
81.10.Dn, 61.72.Ff, 77.84.Fa, 68.35.Fx (all)
G.V. Spivak, G.V. Saparin, M.V. Bykov “Scanning electron microscopy” Sov. Phys. Usp. 12 756–776 (1970)
07.78.+s, 68.37.Hk, 78.60.Hk, 61.72.Ff, 87.64.Ee (all)
L.G. Orlov, M.P. Usikov, L.M. Utevskii “Electron-microscope observation of dislocations in metals” Sov. Phys. Usp. 5 53–78 (1962)
61.72.Ff, 61.72.Ji, 61.72.Nn (all)
E.Yu. Kokorish, N.N. Sheftal’ “Dislocations in semiconductor crystals” Sov. Phys. Usp. 3 840–849 (1961)
61.72.Bb, 61.72.Ff, 62.20.Fe, 71.20.Mq, 72.20.Jv, 61.72.Ss (all)
D.M. Vasil’ev, B.I. Smirnov “Certain X-RAY diffraction methods of investigating cold worked metals” Sov. Phys. Usp. 4 226–259 (1961)
61.10.Nz, 62.20.Fe, 61.72.Nn, 61.66.Bi, 61.72.Ff (all)

PACS numbers