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Issue 12, 2024
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Qi-Zhen Xue



Institute for Materials Research, Tohoku University
Address: 2-1-1 Katahira, Sendai, 980-77, Japan

Articles

  1. R.Z. Bakhtizin, Q.-Zh. Xue, Q.-K. Xue et al “Scanning tunneling microscopy studies of III-nitride thin film heteroepitaxial growth” Phys. Usp. 47 371–391 (2004)

See also: Q.-K. Xue, T. Sakurai, R.Z. Bakhtizin, K.-H. Wu

PACS: 61.14.Hg, 71.15.Nc, 81.05.Ea
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