The paper reports principles of a new technique based on neutron scattering — resonant neutron reflectometry. It utilizes the resonant amplification of the neutron wave field in quasi-2D layered systems. The practical implification of this approach significantly increases sensitivity in determining the parameters of structural and magnetic potentials, the position of magnetic layers, as well as the spatial distribution of isotopes in multilayered nanostructures. It can be considered as an effective technique complementary to the standard reflectometry.