L. Reimer. Scanning Electron Microscopy: Physics of Image Formation and Microanalysis. Springer-Verlag, Berlin; Heidelberg; New York; Tokyo, 1985, pp. 457 (Springer Series in Optical Sciences. V. 45).
PACS:68.37.Hk DOI:10.1070/PU1987v030n06ABEH002866 URL: https://ufn.ru/en/articles/1987/6/q/ Citation: Dyukov V G "Scanning electron microscopy" Sov. Phys. Usp.30 552–552 (1987)