Metalenses for subwavelength imaging

K.V. Baryshnikova^†^a, S.S. Kharintsev^‡^b, P.A. Belov^§^a, N.A. Ustimenko^*^a, S.A. Tretyakov^#^c, C.R. Simovskii^°^a, c
^aITMO University, Kronverksky Pr. 49, bldg. A, St. Petersburg, 197101, Russian Federation
^bKazan Federal University, Institute of Physics, 16 Kremlyovskaya str, Kazan, 420008, Russian Federation
^cAalto University, School of Electrical Engineering, P.O. Box 11000, Aalto, FI-00076, Finland

Devices that form an optical image with a subwavelength resolution in real time — metalenses — are considered. Such devices either operate with near optical fields or convert near fields into wave fields. As a result, the spatial resolution of these devices is not limited by the diffraction limit. At the same time, the image is formed at a considerable distance from the object, which distinguishes near-field metalenses from the instruments used in near-field probe microscopy. Metalenses are implemented based on metamaterials or their two-dimensional analogs, metasurfaces. Historically, this line of research was based on the so-called perfect lens, the concept of which did not withstand experimental verification but gave impetus to the development of real metalenses. Depending on the device and principle of operation, metalenses are called either superlenses or hyperlenses.

Keywords: diffraction limit, subwavelength resolution, near field, materials with a negative refractive index, plasmon
PACS: 42.30.−d
DOI: 10.3367/UFNe.2021.03.038952
URL: https://ufn.ru/en/articles/2022/4/b/
Web of Science

000848072400002
Scopus

2-s2.0-85145436206
ADS NASA

2022PhyU...65..355B
Citation: Baryshnikova K V, Kharintsev S S, Belov P A, Ustimenko N A, Tretyakov S A, Simovskii C R "Metalenses for subwavelength imaging" Phys. Usp. 65 355–378 (2022)

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Received: 26th, August 2020, revised: 12th, March 2021, accepted: 19th, March 2021

Оригинал: Барышникова К В, Харинцев С С, Белов П А, Устименко Н А, Третьяков С А, Симовский К Р «Металинзы для получения изображений с субволновым разрешением» УФН 192 386–412 (2022); DOI: 10.3367/UFNr.2021.03.038952

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