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Metalenses for subwavelength imaging

  a,   b, §  a, *  a, #  c, °  a, c
a ITMO University, Kronverksky Pr. 49, bldg. A, St. Petersburg, 197101, Russian Federation
b Kazan Federal University, Institute of Physics, 16 Kremlyovskaya str, Kazan, 420008, Russian Federation
c Aalto University, School of Electrical Engineering, P.O. Box 11000, Aalto, FI-00076, Finland

Devices that form an optical image with a subwavelength resolution in real time — metalenses — are considered. Such devices either operate with near optical fields or convert near fields into wave fields. As a result, the spatial resolution of these devices is not limited by the diffraction limit. At the same time, the image is formed at a considerable distance from the object, which distinguishes near-field metalenses from the instruments used in near-field probe microscopy. Metalenses are implemented based on metamaterials or their two-dimensional analogs, metasurfaces. Historically, this line of research was based on the so-called perfect lens, the concept of which did not withstand experimental verification but gave impetus to the development of real metalenses. Depending on the device and principle of operation, metalenses are called either superlenses or hyperlenses.

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Fulltext is also available at DOI: 10.3367/UFNe.2021.03.038952
Keywords: diffraction limit, subwavelength resolution, near field, materials with a negative refractive index, plasmon
PACS: 42.30.−d
DOI: 10.3367/UFNe.2021.03.038952
URL: https://ufn.ru/en/articles/2022/4/b/
000848072400002
2-s2.0-85145436206
2022PhyU...65..355B
Citation: Baryshnikova K V, Kharintsev S S, Belov P A, Ustimenko N A, Tretyakov S A, Simovskii C R "Metalenses for subwavelength imaging" Phys. Usp. 65 355–378 (2022)
BibTexBibNote ® (generic)BibNote ® (RIS) MedlineRefWorks
PT Journal Article
TI Metalenses for subwavelength imaging
AU Baryshnikova K V
FAU Baryshnikova KV
AU Kharintsev S S
FAU Kharintsev SS
AU Belov P A
FAU Belov PA
AU Ustimenko N A
FAU Ustimenko NA
AU Tretyakov S A
FAU Tretyakov SA
AU Simovskii C R
FAU Simovskii CR
DP 10 Apr, 2022
TA Phys. Usp.
VI 65
IP 4
PG 355-378
RX 10.3367/UFNe.2021.03.038952
URL https://ufn.ru/en/articles/2022/4/b/
SO Phys. Usp. 2022 Apr 10;65(4):355-378

Received: 26th, August 2020, revised: 12th, March 2021, 19th, March 2021

Оригинал: Барышникова К В, Харинцев С С, Белов П А, Устименко Н А, Третьяков С А, Симовский К Р «Металинзы для получения изображений с субволновым разрешением» УФН 192 386–412 (2022); DOI: 10.3367/UFNr.2021.03.038952

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