X-ray crystal interferometers

V.V. Lider
Federal Scientific Research Center "Crystallography and Photonics", Russian Academy of Sciences, Shubnikov Institute of Crystallography, Russian Academy of Sciences, Leninskii prosp. 59, Moscow, 119333, Russian Federaion

Various configurations of the X-ray crystal interferometer are reviewed. The interferometer applications considered include metrology, the measurement of fundamental physical constants, the study of weakly absorbing phase objects, time-resolved diagnostics, the determination of hard X-ray beam parameters, and the characterization of structural defects in the context of developing an X-ray Michelson interferometer. The three-crystal Laue interferometer (LLL-interferometer), its design and the experimental opportunities it offers are given particular attention.

PACS: 07.85.−m, 41.50.+h, 61.05.cp (all)
DOI: 10.3367/UFNe.0184.201411e.1217
URL: https://ufn.ru/en/articles/2014/11/d/
Web of Science

000349435700004
Scopus

2-s2.0-84922715968
ADS NASA

2014PhyU...57.1099L
Citation: Lider V V "X-ray crystal interferometers" Phys. Usp. 57 1099–1117 (2014)

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@article{Lider:2014,
	author = {V. V. Lider},
	title = {X-ray crystal interferometers},
	publisher = {Physics-Uspekhi},
	year = {2014},
	journal = {Phys. Usp.},
	volume = {57},
	number = {11},
	pages = {1099-1117},
	url = {https://ufn.ru/en/articles/2014/11/d/},
	doi = {10.3367/UFNe.0184.201411e.1217}
}

Received: 28th, October 2013, revised: 27th, December 2013, accepted: 27th, December 2013

Оригинал: Лидер В В «Рентгеновские кристаллические интерферометры» УФН 184 1217–1236 (2014); DOI: 10.3367/UFNr.0184.201411e.1217