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Low-temperature investigations of surfaces of certain semiconductors

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Fulltext is also available at DOI: 10.1070/PU1987v030n08ABEH002949
PACS: 68.35.Bs, 68.47.Fg, 68.43.−h, 79.60.Bm, 68.49.Jk, 61.14.Hg (all)
DOI: 10.1070/PU1987v030n08ABEH002949
URL: https://ufn.ru/en/articles/1987/8/o/
Citation: Grazhulis V A "Low-temperature investigations of surfaces of certain semiconductors" Sov. Phys. Usp. 30 745–745 (1987)
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Оригинал: Гражулис В А «Низкотемпературные исследования поверхностей некоторых полупроводников» УФН 152 703–704 (1987); DOI: 10.3367/UFNr.0152.198708o.0703

References (3) Similar articles (20) ↓

  1. A.G. Vinogradov, A.S. Gurvich et alThe backscattering enhancement effectSov. Phys. Usp. 30 747–748 (1987)
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  20. V.S. Shpinel’ “Nuclear-spectroscopic studies of hyperfine interactions for impurities in metalsSov. Phys. Usp. 30 538–539 (1987)

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