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Low-temperature investigations of surfaces of certain semiconductors

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Fulltext is also available at DOI: 10.1070/PU1987v030n08ABEH002949
PACS: 68.35.Bs, 68.47.Fg, 68.43.−h, 79.60.Bm, 68.49.Jk, 61.14.Hg (all)
DOI: 10.1070/PU1987v030n08ABEH002949
URL: https://ufn.ru/en/articles/1987/8/o/
Citation: Grazhulis V A "Low-temperature investigations of surfaces of certain semiconductors" Sov. Phys. Usp. 30 745–745 (1987)
BibTexBibNote ® (generic) BibNote ® (RIS)MedlineRefWorks
TY JOUR
TI Low-temperature investigations of surfaces of certain semiconductors
AU Grazhulis, V. A.
PB Physics-Uspekhi
PY 1987
JO Physics-Uspekhi
JF Physics-Uspekhi
JA Phys. Usp.
VL 30
IS 8
SP 745-745
UR https://ufn.ru/en/articles/1987/8/o/
ER https://doi.org/10.1070/PU1987v030n08ABEH002949

Оригинал: Гражулис В А «Низкотемпературные исследования поверхностей некоторых полупроводников» УФН 152 703–704 (1987); DOI: 10.3367/UFNr.0152.198708o.0703

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